In a real sense, Hewlett-Packard sold MEASUREMENTS as well as products. According to one marketing professional, when you go to a hardware store to buy a 5mm drill bit, what you really want is a 5mm hole. So, likewise, as HP developed their massive line of innovative measurement instruments, the customers often had to be educated in the newer processes of the new measurement techniques, permitted by the newest product.
In-depth discussions of important techniques developed by HP engineers and written by them are published in the Hewlett-Packard Application Note Series. In the HP numbering and archiving strategy, Application Note titles were assigned to generic measurement tutorials, which might cover multiple instrument numbers.
Another category of technical notes were called Product Notes. Product Notes were instrument-specific and although a wide range of topics were permitted, in general, PNs expanded on instrument performance characteristics beyond the Technical Data Sheet of product descriptions and specs.
Application Notes (even old ones) are being posted by the Agilent Technologies Company. Starting from the Agilent's web site home page, select "Technical Support" and "Application Notes" then, filling the search box with the AN number you are looking for, you can get results that include vintage application notes.
The listing gives the following information:
AN-Nbr | DATE | Related Instr | TITLE |
---|---|---|---|
3 | 1958 | - | Measurement of RF Pulse Carrier Frequency |
4 | ? | AC-4A | Model AC-4A Decade Counter |
6 | 1960 | - | Homodyne Generator and Detection System |
6-65 | 1965? | 69XX | DC Power Supplies - Harrison/HP |
7 | ? | 430C | Hewlett-Packard Model 430C Microwave Power Meter Accuracy |
9 | ? | 490A | Doppler Frequency Shift Simulation at Microwave Frequencies using Traveling Wave Tube Amplifier |
10 | ? | - | Microwave Spectrum Synthesis with the Traveling-Wave Tube |
11 | 1955 | - | Domesticating the Traveling Wave Tube |
12 | 1959 | - | How a Helix Backward-Wave Tube Works |
14 | 1955 | 49X | Traveling-Wave Tube Amplifiers |
16 | 1964 | - | Waves on Transmission Lines |
17 | 1966 | - | Square Wave & Pulse Testing of Linear Systems |
18 | 1959 | - | Introduction to Solid State Devices |
20 | 1961 | 612A | Signal Generator Output Attenuators |
20 | 1965 | 612A | HP Signal Generator Output Attenuators |
21 | 1961 | - | Microwave Standards Prospectus |
24 | ? | - | Pulse Modulation of Audio Oscillators |
25 | 1961 | 120-130-1XX | Cathode Ray Tube Phosphors and the Internal Graticule Cathode Ray Tube |
29 | ? | - | A Convenient Method for Measuring Phase Shift (With CRT Graticul Mask) |
30 | 1964 | 608-803-417 | Measurement of Cable Characteristics |
31 | ? | 202A | Externally Driving the 202A Low Frequency Function Generator |
32 | 1963 | 50X-56X | Guide for Selecting HP and DYMEC Digitizing Instruments for Specific Applications |
36 | ? | - | Sampling Oscillography |
37 | 1959 | 120A-130A | Monitoring a Radio Transmitter Signal with a 120A or 130A Oscilloscope |
38 | 1962 | - | Microwave Measurements for Calibration Laboratories |
41A | 1960 | 405AR | A Hold-Off Circuit for the Model 405AR Digital Voltmeter |
41B | 1960 | 405AR | Increased Resolution for Permanent Records of DC Voltage with hp Model 405AR |
41D | 1960 | 405AR | Decreasing the Response Time of the Model 405 Input Filter |
43 | 1960 | 344A | Continious Monitoring of Radar Noise Figure |
44A | 1960 | 185A | Synchronizing the hp 185A Oscilloscope |
44B | 1960 | 185A | More Information and Easier Pulse Analysis with the Model 185A Oscilloscope |
44D | ? | 18X | Characteristics and Use of hp Sampling Oscilloscope Probe and Accessories |
45 | 1963 | 428A | Direct Reading Test Meter Simplifies Magnetic Ink Printing Quality Control |
46 | 1960 | - | Introduction to microwave measurements |
47 | 1961 | 524C-D | Providing 100-, 1,000-, and 10,000-Second Gate Times for the hp Model 524C/D Counter |
48 | 1965 | 218A | Applications of the hp Model 218A, a Versatile General-Purpose Pulse and Delay Generator |
52 | 1965 | 5060A ++ | Frequency and Time Standards |
52-1 | 1974 | - | Fundamentals of Time and Frequency Standards |
52-2 | 1975 | - | Timekeeping and Frequency Calibration |
53 | 1962 | 185B | Transmission Line Testing Using the Sampling Oscilloscope |
55 | 1962 | 302A | Converting the Model 302A Wave Analyzer for Use with Grounded-Input Recorders |
56 | 1967 | - | Microwave Mismatch Error Analysis |
57 | 1965 | 34X | Noise Figure Primer |
57-1 | 1983 | 8970A | Fundamentals of RF and Microwave Noise Figure Measurements |
57-1 | 2000 | 859X-NFA | Agilent Fundamentals of RF and Microwave Noise Figure Measurements |
57-2 | 1988 | 8970B | Noise Figure Measurement Accuracy |
57-2 | 2001 | 8590X-346X | Noise Figure Measurement Accuracy - The Y-Factor Method |
57-3 | 2000 | - | 10 Hints for Making Successful Noise Figure Measurements |
58 | 1963 | 8714A | The PIN Diode as a Microwave Modulator |
58 | 1967 | - | The PIN Diode as a Microwave Modulator |
59 | 1965 | 310-1110A | Loop Gain Measurement with hp Wave Analyzers |
60 | 1967 | 4XX-34XX | Which AC Voltmeter ? |
61 | 1964 | 690-691-130C | Leveled Swept-Frequency Measurements with Oscilloscope Display |
62 | 1964 | 1415A | Time Domain Reflectometry |
62 | 1988 | 54120T | TDR Fundamentals - For Use with hp 54120T Digitizing Oscilloscope and TDR |
62-1 | 1988 | 54120T | Improving Time Domain Network Analysis Measurements |
62-2 | 1990 | 54120 | TDR Technics for Differential Systems |
62-3 | 1990 | 541XX | Advanced TDR Technics |
63 | 1968 | 8551A | Spectrum Analysis |
63A | 1967 | 8551A | More on Spectrum Analysis |
63B | 1968 | 8441A | The 8441A Preselector : Advancement in the Art of Spectrum Analysis |
63C | ? | 8551A | Measurement of White Noise Power Density |
63D | 1968 | 8551A-8406A | Accurate Frequency Measurement: An Application of Spectrum Analysis |
63E | 1969 | 8551A | Modern EMI Measurements |
63E-1 | 1978 | - | Quasi-Peak Measurements Using a Spectrum Analyzer |
63E-1 | ? | - | Quasi-Peak Measurements Using a Spectrum Analyzer - Corrective of AN63E-1 Above |
64 | 1965 | 43X | Microwave Power Measurement |
64 | 1968 | 43X | Microwave Power Measurement |
64-1 | 1977 | 43X | Fundamentals of RF and Microwave Power Measurements |
64-1A | 1997 | EPM-44X | Fundamentals of RF and Microwave Power Measurements |
64-2 | 1978 | 436A | Extended Applications of Automatic Power Meters |
64-3 | 1980 | 436A-346A | Accurate and Automatic Noise Figure Measurements Zip file |
64-4A | 1997 | EPM-44X | 4 Steps for Making Better Power Measurements |
65 | 1965 | 690C-D | Swept Frequency Techniques |
66 | 1965 | 690 | Swept SWR Tests in X-Band Coax |
67 | 1968 | 1415A-1815B | Cable Testing with Time Domain Reflectometry (With TDR Slide Rule) |
68 | 1965 | 8614-8616B | Accurate Receiver Sensitivity Measurements |
69 | 1965 | 34XX ++ | Which DC Voltmeter ? |
70 | 1969 | 740-741B | Precise DC Measurements |
71 | 1966 | 606-608 | Advances in RF Measurements Using Modern Signal Generators 50Kc-480Mc |
72 | 1966 | 5201L-5551A | Integral Counting |
73 | 1966 | 5201L-5551A | Calibration of a Gamma Ray Spectrometer RARbook |
75 | 1966 | 1415A | Selected Articles on Time Domain Reflectometry Applications |
76 | 1967 | 230A | Using the 230A Power Amplifier |
77-1 | 1967 | 8405A | Transistor Parameter Measurements |
77-2 | 1966 | 8405A | Precision Frequency Comparison |
77-3 | 1967 | 8405A | Measurement of Complex Impedance 1-1000 MHz |
77-4 | 1968 | 8405A | Swept-Frequency Group Delay Measurements |
78-1 | 1966 | DYMEC-2801 | Calibrating the Quartz Thermometer |
78-2 | 1966 | DYMEC-2801 | Molecular Weight Determination with the Quartz Thermometer |
78-3 | 1968 | HP2801A | Calorimetry and the Quartz Thermometer |
78-4 | 1968 | HP2801A | A Glossary of Terms Pertaining to Temperature Measurements |
78-5 | 1971 | HP2801A | Applications of the Quartz Crystal Thermometer |
81 | 1967 | 203A | Low Frequency Phase Shift Measurement Techniques |
82 | 1966 | - | Power Supply/Amplifier Concepts and Modes of Operation |
83 | 1966 | - | Increased Output Resistance for DC Regulated Power Supplies |
84 | 1967 | 1416A | Swept SWR Measurement in Coax |
85 | 1966 | 5280A | Using a Reversible Counter |
86 | 1968 | 4800A-4815A | Using the Vector Impedance Meters |
87 | 1967 | 5210A | FM and PM Measurements |
88 | 1970 | - | Logic Symbology |
89 | 1967 | 3960-3968 | Magnetic Tape Recording Handbook |
90 | 1967 | HP-HARRISON | DC Power Supply Handbook |
90B | 1978 | HP-Only | DC Power Supply Handbook |
91 | 1968 | 8405A | How Vector Measurements Expand Design Capabilities 1 to 1000 Mhz |
92 | ? | 8410 | Network Analysis at Microwave Frequencies |
93 | 1969 | 540X | Statistical Analysis of Waveforms and Digital Time-Waveform Measurements |
93 | ? | 5400A | Electronic Application of the 5400A (Technical Information Note 93) |
94 | 1968 | - | Connector Design Employing TDR Techniques |
95 | 1968 | 8410 ++ | S-Parameters… Circuit Analysis and Design |
95A | 1973 | - | Selected Reprints on S-Parameters… Circuit Analysis and Design |
95-1 | ? | - | S-Parameter Techniques for Faster, More Accurate Network Design (Paper part of AN95) |
96 | 1969 | 5105-5110B | HP Direct-Type Frequency Synthesizers Theory, Performance and Use |
98-1 | ? | 3722A | Noise at Work - Model 3722A Aids Design of Process Control Systems |
98-2 | 1969 | H01-3722A | Noise at Work - A Point by Point Correlator for the H01-3722A |
99 | 1968 | 8541A | 8541A Automatic Network Analyzer Measurement Capabilities |
100 | 1968 | - | Acoustics Hanbook |
101 | 1963 | 7560-7561A | Multiplication and Division by Logarithms (HP-Moseley Division) |
102 | 1963 | 7000-7100 | Program Controllers (HP-Moseley Division) |
105 | 1961 | MOSELEY | Polarography |
105 | 1967 | - | Polarography (HP-Moseley Division) |
106 | 1967 | 135-Moseley | Electric Motor Testing Performance (HP-Moseley Division) |
107 | 1965 | - | Guard Circuits (HP-Moseley Division) |
108 | 1966 | 101-Moseley | Hysteresis Curve Plotting (HP-Moseley Division) |
109 | 1969 | 62XX | Power Supply Overvoltage "CROWBARS" |
110 | 1968 | 8410 | Anrenna/Radome Boresight Error Measurements |
112-1 | 1968 | 675-676A | Low-Frequency Network Analysis with the 675A/676A |
112-2 | 1969 | 675-676A | Using the 675A/676A Network Analyzer as an Educational Tool |
114 | 1969 | 653A | A2A Video Transmission System Alignment |
115 | 1970 | - | Principles of Cathode-Ray Tubes, Phosphors, and High-Speed Oscillography |
116 | 1969 | 5360A | Precision Frequency Measurements |
117-1 | 1970 | 8410 | Microwave Network Analyzer Applications |
117-2 | 1971 | 8410-11608A | Stripline Component Measurements with the 8410A Network Analyzer |
118 | 1970 | 1815A | Dielectric Measurements with Time Domain Reflectometry |
120 | 1969 | 5360A | A New Technique for Pulsed RF Measurements |
120-2 | 1970 | 5360A | Measuring Phase with the 5360A Computing Counter |
120-3 | 1970 | 5360A | Non-Linear Systems Applications of the Computing Counter System |
121-1 | 1970 | 8407A | Network Analysis with the HP 8407A 0,1 - 110 MHz |
121-2 | 1970 | 8407A | Swept Impedance with the HP 8407A 0,1 - 110 MHz |
122 | 1968 | 8551A | EMI Measurement Procedure (according to MIL-STD 826A) |
123 | 1970 | - | Floating Measurements and Guarding |
124 | 1970 | - | True RMS Measurements |
125 | 1970 | 3480B-2912A | Data Acquisition - 3480B Digital Voltmeter - 2912A Scanner - 2547A Coupler |
126 | 1970 | 3590A | Theory and Applications of Wave Analyzers |
127 | 1970 | 5480B | Signal Averaging Enhancement of RF and Pulse Measurements |
128 | 1970 | 6177B-618XB | Applications of a DC Constant Current Source |
129 | ? | - | Logic Timing Measurements |
130 | 1970 | 2570A | Instrumentation Control with the HP Coupler/Controller |
131 | 1971 | 2570-2575A | Time-Sharing Based Instrumentation Terminal |
132 | 1971 | 2570A-9100 | Calculator Based Instrumentation Systems |
133-1 | 1971 | 3480-180A | Low Frequency Pulse Amplitude Measurements |
133-2 | 1971 | 3485A | A Guide to Remote Control of the 3485A Scanning Unit |
133-3 | 1971 | 3480-2070A | A Guide to Using Data Storage |
133-4 | 1972 | 3480-2070A | A Guide to Using Sample-and-Hold |
134 | 1971 | 8556A-8552B | Audio Frequency Measurements with the 8556A-8552B Spectrum Analyzer |
135-1 | 1971 | 2116 ++ | Computerized Data Acquisition Aids Final Testing |
135-2 | 1971 | 2116 ++ | High-Volume Production Testing |
135-3 | 1971 | 2116 ++ | Process Monitoring in Manufacturing |
135-4 | 1971 | 2116 ++ | Closed-Loop Production Testing |
135-5 | 1971 | 2116 ++ | A Mobile Process Control Laboratory |
135-6 | 1971 | 2116 ++ | Computer Analysis Aids Battery Testing |
135-7 | 1971 | 2114-2116 ++ | Data Acquisition and Analysis at Sea |
135-8 | 1971 | 2116 ++ | Minicomputer System Aids Busy Psychology Lab |
135-9 | 1971 | 2116 ++ | In-Flight Data Analysis Improves Airborne Research |
135-10 | 1971 | 2114 ++ | Computer Speeds Gas Turbine Combustor Testing |
135-11 | 1971 | 2116 ++ | Stable Measurements on the High Seas |
135-12 | 1971 | 2116 ++ | Depot Testing of Avionic Modules |
135-13 | 1973 | 2116 ++ | Domestic Communications Satellites - A World's First |
135-14 | 1972 | 2115 ++ | Computerized Process Control Improves Sugar Refinery Production |
135-15 | 1972 | 2116 ++ | Minicomputer System Benefits Fuel Cell Technology |
135-16 | 1972 | 2116 ++ | Minicomputer Systems Aid Military Vehicle Testing |
135-17 | 1972 | 2116 ++ | Testing Ovonic Read-Mostly Memories |
135-18 | ? | 2100A ++ | An Automated Engine Laboratory in a Research Environment |
135-19 | 1972 | 2116 ++ | Testing Thick-Film Hybrid Circuits |
135-21 | 1973 | 9500 ++ | Viggen Avionics Support |
135-22 | 1973 | 2100 ++ | Real-Time Multiprogramming System Boosts Productivity for NCR |
135-23 | 1973 | 9500 ++ | Television Set Production Revolutionized by Automatic Alignment and Test |
135-24 | 1973 | 2100A ++ | Automated System Improves Spacecraft Testing |
135-25 | 1973 | 2116 ++ | Automation in Production Testing |
136 | 1973 | 8445B-8555A | Understanding and Operating the 8555A Spectrum Analyzer and 8445B Preselector |
137 | 1971 | 4470A | Probing Transistor Noise |
138 | 1971 | 5401B | Multichannel Analyzer Applications |
139 | 1971 | 5586A | Stabilizing Gamma-Ray Spectrometer Systems with the HP 5586A Spectrum Stabilizer RARbook |
140-0 | ? | 5450 | Fourier Analayser Training Manual |
140-1 | 1971 | 5450 | Detecting Sources of Vibration and Noise Using HP Fourier Analyzers |
140-2 | 1971 | 5450 | Feedback Loop and Servomechanism Measurements Using HP Fourier Analyzers |
140-3 | 1972 | 5451 | Dynamic Testing of Mechanical Systems Using Impulse Testing Techniques |
140-4 | ? | 5451 | Digital Auto-Power Spectrum Measurements |
140-5 | 1973 | 5451 | Measurement of Transfer Functions with Wide Dynamic Range |
140-6 | 1973 | 5451 | Measurement of Machine Tool Vibration |
140-7 | 1974 | 5451 | Nuclear Power Plant Diagnostics Using Fourier Analysis Techniques |
141 | 1971 | 5257A | AM, FM Measurements with the Transfer Oscillator |
142-XX | 1968 | 8551 | EMI Measurement Procedure (With 8551 Calibration Slide Rule) |
142 | 1972 | 855X | EMI Measurement Procedure |
144 | ? | - | Understanding Microwave Frequency Measurements |
145-1 | 1971 | 2000C | First Small Computer Solution to Text Editing Systems |
145-2 | 1971 | 2114 | Minicomputer Untangles Massive Inventory Problem in Heavy Industry |
145-3 | 1971 | 2116B | Flexible Computer-Controlled Laser System Revolutionizes Garment Industry |
145-4 | 1971 | 2000C | Inexpensive Time-Share System Solves Unique College Registration Problems |
145-5 | 1971 | 2000C | Computer System Helps Graduate Business School Teach Management Technology |
145-6 | 1972 | 2000C | Dedicated Time-Sharing Fills Multitude of Management Needs |
145-7 | 1972 | 2000B | Computer System Helps Motivate High School Students |
145-8 | 1972 | - | Minicomputer Systems Improve Auto Maker's Production Efficiency |
145-9 | 1972 | 2120A | Low-Cost Batch System Streamlines Construction Projects |
145-9 | 1973 | 2100 | Microprogrammable Mini Expand University Computer Science Program |
145-10 | 1972 | 2100A | Rugged Minicomputer System Helps Ships Find the Sure, Safe Way |
145-11 | 1972 | 2000X | Time-Shared Systems Expand Scope of Education |
145-12 | 1972 | 2000 | Inexpensive Computer System "Does it All" for Small Manufacturer |
145-13 | 1972 | 2000 | Computer Systems Raise Student Achievement Levels |
145-14 | 1972 | 2100 | Small Computer System Pinpoints Suspects for Police Departments |
145-15 | 1973 | 2000 | Computer Systems Help University Provide Quality, Personalized Instruction |
145-16 | 1973 | 2100 | Small Computer System Keeps Apparel Industry in Style |
145-17 | 1973 | 2000 | Versatile Computer Systems Streamlining Hawaiian Industry |
145-18 | 1973 | 2100 | Small Computer System Keeps Meteorologists on Top of the Weather |
145-19 | 1973 | 200X | Small System Provides Bank with Versatile New Problem-Solver |
145-20 | 1973 | 2100 | Efficient Computer Systems Help Firm Maintain Competitive Edge |
145-25 | 1974 | 200X | Computer Network Connects Field Offices and Manufacturing Divisions |
150 | 1974 | 855X | Spectrum Analysis…. Spectrum Analyzer Basics |
150 | 1989 | 70XXX | Spectrum Analysis…. Spectrum Analyzer Basics |
150A | 1973 | 8558B | Spectrum Analysis…. Using the 8558B Spectrum Analyzer |
150B | 1978 | 8557A-8558B | Spectrum Analysis…. Using the 8557A and 8558B Spectrum Analyzers |
150-1 | 1971 | 855X | Spectrum Analysis Amplitude and Frequency Modulation |
150-1 | 1989 | - | Spectrum Analysis Amplitude and Frequency Modulation |
150-2 | 1971 | 855X | Spectrum Analysis…. Pulsed RF (With Pulsed RF Calculator Slide Rule) |
150-3 | 1974 | 855X-8444A | Spectrum Analysis…. Swept Frequency Measurements and Selective Frequency Counting with a Tracking Generator |
150-4 | 1974 | 855X | Spectrum Analysis…. Noise Measurements |
150-5 | 1973 | 855X | Spectrum Analysis…. CRT Photography and X-Y Recording Techniques |
150-6 | 1974 | 855X | Spectrum Analysis…. CATV Proof of Performance |
150-7 | 1975 | 855X | Spectrum Analysis…. Signal Enhancement |
150-8 | 1976 | 855X | Spectrum Analysis…. Accuracy Improvement |
150-9 | 1976 | 855X | Spectrum Analysis…. Noise Figure Measurement |
150-10 | 1976 | 855X | Spectrum Analysis…. Field Strength Measurement |
150-11 | 1976 | 855X | Spectrum Analysis…. Distorsion Measurement |
150-12 | 1977 | 8565A-11517A | Spectrum Analysis…. Using the HP 11517A External Mixer to 40 GHz |
150-13 | 1978 | 8565A-8709A | Stimulus-Response Measurements… Using the HP 8565A Spectrum Analyzer from 2-18 GHz |
150-14 | 1978 | 855X | Spectrum Analysis…. Using External Waveguide Mixers Above 40 GHz |
150-15 | 2004 | VSA | Vector Signal Analysis Basics |
151 | 1973 | - | Fundamentals of Air Navigational Systems |
152 | 1972 | - | Probing in Perspective |
153 | 1972 | 1415A-1815A | Permeability, Permittivity and Conductivity Measurements with Time Domain Reflectometry |
153-1 | 1997 | 815X | The Basics of Fiber Optic Measurement and Calibration |
154 | 1972 | 8410 ++ | S-Parameter Design |
154 | 1990 | 8510-875X | S-Parameter Design |
155-1 | 1976 | 8755 ++ | Active Device Measurements with the HP 8755 Frequency Response Test Set |
155-2 | 1977 | 8755 ++ | 100 dB Dynamic Range Measurements Using the HP 8755 Frequency Response Test Set |
155-3 | 1981 | 8755S | Automating the HP 8755 Scalar Network Analyzer |
156-1 | ? | 5526A | Laser Measurement System - Remote Laser Interferometry |
156-2 | ? | 5526A | Laser Measurement System - Calibration of a Surface Plate |
156-3 | 1972 | 5510A | Laser Measurement System - Principles of Automatic Compensation |
156-4 | ? | 5526A | Laser Measurement System - Calibration of a Machine Tool |
156-4 | ? | 5526A | Système de Mesure à Laser - Etalonnage d'une Machine Outil (French Translation of AN 156-4) |
156-5 | 1976 | 5526A | Laser Measurement System - Measurement of Straightness of Travel |
156-5 | 1979 | 5526A | Système de Mesure à Laser - Mesure de la Rectitude d'un Déplacement (French Translation of AN 156-5) |
157 | 1972 | 3570-3575 ++ | Low Frequency Gain Phase Measurements |
158 | 1973 | 34XX ++ | Selecting the Right DVM |
161-1 | ? | 9800-9830 | Structural Engineering Applications - HP Series 9800 - The Name and Number That Save Time and Money |
161-2 | ? | 9800-9830 | Electrical Engineering - Transformer Engineers Save Time, Improve Accuracy with Calculator-Aided Design |
162-1 | ? | 5326-5327 | Time Interval Averaging |
163-1 | 1973 | 105XX | Techniques of Digital Troubleshooting |
163-2 | ? | 161X-500X | The IC Troubleshooters - New Techniques of Digital Troubleshooting |
164-1 | 1974 | 8660A-B | Programming the 8660A/B Synthesized Signal Generator (Standard BCD Interface) |
164-2 | 1974 | 8660A-B | Calculator Control of the 8660A/B/C Synthesized Signal Generator (Optional HP-IB Interface) |
164-3 | 1975 | 8660 | New Techniques for Analyzing Phase Locked Loops |
164-4 | 1975 | 8660 | Digital Phase Modulation (PSK) and Wideband FM… Using the 8660A/C Synthesized Signal Generator |
166 | ? | 131X-1321A | Large Screen Display Applications and Interfacing |
166-2 | ? | 1304A | Large Screen Display Applications and Interfacing (Supplement to AN 166) |
167-1 | ? | 5000A | The Logic Analyzer |
167-2 | ? | 1601 | Digital Triggering for Analog Measurements |
167-3 | ? | 1601 | Functional Digital Analysis |
167-4 | 1975 | 1600A-1607A | Engineering in the Data Domain Calls for a New Kind of Digital Instruments (Reprint from Electronics Magazine May 1/75) |
167-5 | 1975 | 1600A-1607A | Troubleshooting in the Data Domain is Simplified by Logic Analyzers (Reprint from Electronics Magazine May 15/75) |
167-5 | 1975 | 1600A-1607A | Le dépannage des Systèmes Travaillant dans le Domain des Etats est Simplifié par l'Emploi des Analyseurs Logiques |
167-6 | ? | 1600A | Mapping a Dynamic Display of Digital System Operation |
167-7 | ? | 1600A | Supplementary Data from Map Displays Without Changing Probes |
167-8 | ? | 1620A-7900A | Stable Displays of Disc System Waveforms Synchronized to Record Address |
167-9 | ? | 1600A-1607A | Functional Analysis of the Motorola M6800 Microprocessor System |
167-9 | 1976 | 1600A-1607A | Analyse Fonctionnelle du Microprocesseur Motorola M6800 (French Translation of AN 167-9) |
167-10 | ? | 1620A | Using the 1620A for Serial Pattern Recognition |
167-11 | ? | 1600A-1607A | Functional Analysis of Intel 8008 Microprocessor Systems |
167-11 | 1976 | 1600A-1607A | Analyse Fonctionnelle du Microprocesseur 8008 Intel (French Translation of AN 167-11) |
167-12 | ? | 1600A-1607A | Functional Analysis of Fairchild F8 Microprocessor Systems |
167-12A | ? | 1600A-1607A | Functional Analysis of Mostek F8 Microprocessor Systems |
167-13 | ? | 1740S | The Role of Logic State Analyzers in Microprocessor Based Designs |
167-14 | ? | 1600A-1607A | Functional Analysis of 8080 Microprocessor Systems |
167-14 | 1976 | 1600A-1607A | Analyse Fonctionnelle du Microprocesseur 8080 (French Translation of AN 167-14) |
167-15 | ? | 1600A-1607A | Functional Analysis of Intel 4004 Microprocessor Systems |
167-16 | ? | 1600A-1607A | Functional Analysis of Intel 4040 Microprocessor Systems |
167-17 | ? | 1600A-1607A | Functional Analysis of National IMP Microprocessor Systems |
167-18 | ? | 1600A-1607A | Functional Analysis of National Semiconductor SC/MP Microprocessor System |
167-19 | ? | 1600A-1607A | Systematic "turn-on" of Microprocessor Systems Using Logic State Analyzers |
170-1 | ? | 8640A-B | HP 8640A/B Signal Generator Output Level Accuracy |
170-2 | 1975 | 8640A-B | HP 8640A/B Signal Generator Third-Order Intermodulation Characteristics |
171-1 | 1974 | 8640-8405A | Crystal Testing with the HP 8640A/B and HP 8405A |
171-2 | 1974 | 8640B | Extending the 8640B Frequency Down to DC |
172 | 1970? | - | The Fundamentals of Electronic Frequency Counters |
173 | 1974 | 5340 ++ | Recent Advances in Pulsed RF and Microwave Frequency Measurements |
173-1 | 1975 | 5345A | Dynamic Measurement of Microwave Voltage Controlled Oscillators with the 5345A Electronic Counter |
174-0 | ? | 5345A | Index to the AN 174 Application Notes Series |
174-1 | ? | 5345A | Measuring the Transfer Characteristic of a Voltage Controlled Oscillator |
174-2 | ? | 5345A | Measuring Differential Nonlinearity of a Voltage Controlled Oscillator |
174-3 | ? | 5345A | Measuring Integral Nonlinearity of a Voltage Controlled Oscillator |
174-4 | ? | 5345A | Measuring Dual VCO Tracking Error |
174-5 | ? | 5345A | Determining Probability Densities (Histograms) with the 5345 Electronic Counter |
174-6 | ? | 5345A | Measuring the Stability of a Frequency Source |
174-7 | ? | 5345A | Measuring Fractional Frequency Deviation (Short Term Stability of Oscillators) |
174-8 | ? | 5345A | Measuring FM Peak-to-Peak Deviation |
174-9 | 1974 | 5345A | Making Automatic Phase Measurements with the 5345A Electronic Counter |
174-10 | 1974 | 5345A | Measuring Electrical Length (Delay) of Cables |
174-11 | 1974 | 5345A-59308A | Measuring Warm-Up Characteristics and Aging Rates of Crystal Oscillators |
174-12 | 1974 | 5345A-59308A | Measuring Frequency Sweep Linearity of Sweep Generators |
174-13 | 1974 | 5345A-59308A | Measuring the Tuning Step Transient Response of VCO's to 18 GHz |
174-14 | 1987 | 5345A | Radar System Characterization and Testing Using the HP 5345A Electronic Counter |
175-1 | 1974 | MLA | Microwave Link Measurement - Differential Phase & Gain at Work |
176-8 to 16 | ? | - | Gas Chromatography / Mass Spectometry Application Notes Series |
181-1 | 1974 | 5340A | Measuring Linearity of VCO's from 10 Hz to 23 GHz |
181-2 | 1974 | 5300B | Data Acquisition with the 5300B Measuring System |
181-2 | 1986 | 535X | Voltage-Contolled Oscillators Characterization |
183 | 1978 | 8755 ++ | High Frequency Swept Measurements |
185 | 1974 | 1722A | Waveform Parameter Measurements Using the Microprocessor Controlled Oscilloscope Model 1722A |
185-2 | ? | 1722A | Transmission Line Matching and Length Measurements Using the Microprocessor Controlled Oscilloscope Model 1722A |
185-3 | ? | 1722A | Percent Amplitude Modulation Measurement in the Time Domain |
185-4 | ? | 1722A | Elimination of Computation on Analog Measurements by Using the Direct Reading Oscilloscope Model 1722A |
186 | ? | 1722A | Dual-Delayed Sweep for Precise Time Interval Measurements |
187-2 | 1975 | 8620-8709 ++ | Configuration of a 2-18 GHz Synthesized Frequency Source Using the 8620C Sweep Oscillator |
187-3 | 1976 | 8755-8410 ++ | Three HP-IB Configurations for Making Microwave Scalar Measurements |
187-4 | 1976 | 8620-8709 | Configuration for a Two-Tone Sweeping Generator |
187-5 | 1976 | 8620-5340 | Calculator Control of the 8620C Sweep Oscillator Using the Hewlett-Packard Interface Bus |
187-6 | 1979 | 8620-8709 ++ | The Frequency Performance of the 8620C Sweep Oscillator Under Remote Programming |
188 | ? | 3050B | Thermocouple Measurements with the 3050B |
190 | 1975 | 8620-8709 ++ | 40 GHz Frequency Measurement with Standard HP Instruments |
191 | 1976 | 534X-5363A | Precision Time Interval Measurements Using an Electronic Counter |
191-1 | 1977 | 5359A-5363A | Automatic Zero Calibration of the 5359A Time Synthesizer at a Designated Remote Location |
191-2 | 1977 | 5359A | Determining Digital Circuit Timing Tolerance to Optimize Adjustment or Design |
191-3 | 1977 | 5370A | Precision Time Interval Measurements in Radar Applications |
191-4 | 1978 | 5370A | Using the 5370A Universal Time Interval Counter to Characterize Pulse Width, Repetition Rate and Jitter |
191-5 | 1980 | 5370A-5363B | Measurement of Propagation Delays Using the 5370A Time Interval Counter and 5363B Time Interval Probes |
191-6 | 1980 | 5370A-5363B | Precise Cable Length and Matching Measurements Using the 5370A Time Interval Counter and 5363B Time Interval Probes |
191-7 | 1987 | 5370B | HP 5370B Universal Time Interval Counter - High-Speed Timing Acquisition and Statistical Jitter Analysis |
192 | 1975 | 358X-855X | Using a Narrow Band Analyzer for Characterizing Audio Products |
195 | 1975 | 8011-8015 | Pulse Generator Techniques in CMOS Applications |
196 | 1975 | 436A | Automated Measurements Using the 436A Power Meter |
196-1 | 1979 | 432C | Automated Power Measurements Using the 432C Power Meter - Including Waveguide and Fiber Optic Measurements |
197-1 | 1975 | 5501A | Laser Interferometers for Position Feedback |
197-2 | ? | 5501A | Laser and Optics |
198 | 1975 | 1230A | Event-Related Triggering a Clear Solution for Digital Signals |
199 | ? | 133X | Small Screen Displays Medical Diagnostic System Applications and Interfacing |
200 | 1978 | 53XX | Fundamentals of the Electronic Counters |
200 | 1997 | 53XX | Fundamentals of the Electronic Counters |
200-1 | 1977 | 53XX | Fundamentals of Microwave Electronic Counters |
200-1 | 1997 | 53XX | Fundamentals of Microwave Electronic Counters |
200-2 | ? | - | Fundamentals of Quartz Oscillators |
200-3 | ? | 53XX | Fundamentals of Time Interval Measurements |
200-4 | 1997 | 53XX | Understanding Frequency Counter Specifications |
201-1 | 1976 | 2108A ++ | Automatic Q-A Evaluation of Precision Resistors |
201-2 | 1976 | 2108A ++ | Measuring Differential Non-Linearity of a Voltage-Controlled Oscillator |
201-3 | 1976 | 2113A ++ | A Multiple Station Electronic Test System |
201-4 | 1977 | HP1000 ++ | Performance Evaluation of HP-IB Using RTE Operating Systems |
201-5 | 1977 | HP1000 ++ | The HP-IB Link: Control of Distributed HP-IB Devices |
201-6 | 1980 | HP1000-9825 | Computer Communications: HP 9825 - HP 1000 |
201-7 | 1978 | HP1000-3455 | High-Performance Software for the HP 3455A/3495A Subsystem |
201-8 | 1979 | HP1000 ++ | The Use of Device Subroutines with the HP 1000 Computers |
202-01 | 1976 | 2100S-7260A | Optical Mark Reader Substantially Incease Productivity |
202-03 | 1976 | 7261A | Distributed Hewlett-Packard Optical Mark Readers Provide Easy Remote Data Collection |
204-1 | 1977 | 3050B | Automatic Accelerometer Calibration Helps Assure Air Dropped Cargo Survivability |
204-2 | 1977 | 3050 | Energy Conservation in a Restaurant - Measurement / Computation Using Hewlett-Packard's Data Aquisition System |
205-1 | 1977 | 3042A | Low Frequency Amplitude Considerations of 3042A System |
205-2 | 1979 | 3042A | Sonar Transducer Calibration - Measurement and Computation with Hewlett-Packard's 3042A Automatic Network Analyzer System |
206-1 | 1977 | 3045A | Measuring Wideband Noise with the HP 3045A Automatic Spectrum Analyzer |
207 | 1976 | 3045A | Understanding and Measuring Phase Noise in the Frequency Domain |
210-1 | ? | DTS-70 | Digital Test System - Modeling and Simulation for Digital Testing |
210-4 | ? | DTS-70 | Digital Test System - Designing Digital Circuits for Testability |
212-1 | 1977 | HP1000 | Building an Inventory Control Data Base |
212-2 | 1977 | HP1000 | Building an Order Processing Data Base |
214-1 | 1977 | 704X | Recording with Input Noise Present |
214-2 | 1977 | 704X | X-Y Recorder Dynamic Response |
214-3 | 1977 | 704X | X-Y Recorder Input Connection Configuration and Input Noise |
214-4 | 1977 | 704X | High-Sensitivity X-Y Recorder Has Few Input Restrictions |
216 | ? | 3570A-3571A | A Guide to the Use of HP3570A and 3571A Analyzers |
218-1 | 1977 | 8671A-8672A | Applications & Performance of the 8671A and 8672A Microwave Synthesizers |
218-2 | 1977 | 8671A-8672A | Obtaining Millihertz Resolution from the 8671A & 8672A |
218-3 | 1978 | 8660-8672A | A 1 MHz to 18 GHz Signal Generator with 1, 2, or 3 Hz Resolution |
218-4 | 1979 | 8672-938-940A | Synthesized Signals from 18 to 37,2 GHz Using the 8672A |
218-5 | 1981 | 8672A-11720A | Obtaining Leveled Pulse-Modulated Microwave Signals from the HP 8672A |
219 | 1977 | 8505A | HP 8505A RF Network Analyzer Basic Measurements |
220 | 1977 | 8565A | Operating the HP 8565A Spectrum Analyzer |
221 | 1977 | 8410B-9825A | Semi-Automatic Measurements Using the 8410B Microwave Network Analyzer and the 9825A Desk-Top Computer |
221A | 1980 | 8410B | Automating the HP 8410B Microwave Network Analyzer |
222 | 1977 | 5004A | A Designer's Guide to Signature Analysis |
222 | 1977 | 5004A | Guide d'Utilisation de l'Analyse de Signature (French Translation of AN 222) |
222-1 | ? | 3060A | Implementing Signature Analysis for Production Testing with the HP 3060A Board Test System |
222-2 | 1979 | 5004A | Application Articles on Signature Analysis |
222-3 | 1980 | 5004X | A Manager's Guide to Signature Analysis |
222-4 | 1977 | 2240A | An Intelligent Analog/Digital Subsystem to Simplify Product Test and Equipment Control - Signal Conditioning: HP 22914A Card |
222-5 | 1982 | 500X-HP85 | Increasing Productivity in Manufacturing and Service with a Logic Troubleshooting System |
222-6 | 1983 | 5006A | Troublshooting with Composite Signatures |
222-11 | 1981 | 500X | A Signature Analysis Case Study of a 6800-Based Display Terminal |
222-12 | 1982 | A Signature Analysis Based Test System for ECL Logic | |
223 | ? | 1600A-1741A | Oscilloscope Measurements in Digital Systems |
224-1 | 1977 | 2240A | An Intelligent Analog/Digital Subsystem to Simplify Product Test and Equipment Control - Measurement and Control Examples |
225 | 1978 | 5390A | Measuring Phase Spectral Density of Synthesized Signal Sources Exhibiting F0 and F-1 Noise with the 5390A Freq. Stability Analyzer |
225-1 | ? | 5390A | Measurement Considerations when Using the 5390A Option 010 |
226 | 1977 | 9850A-9825A | Automatic Transceiver Testing with the 8950A |
227 | 1977 | 8016A | Word Generator Techniques in Multi-Channel Applications |
229-1 | 1977 | 7221A | HP-Plot/21 Software Conversion Guide |
231-1 | 1979 | 3779 | Single Channel Codec Testing |
231-2 | 1983 | 3779 | Codec Testing with the HP 3779C/D Primary Multiplex Analyzer |
231-3 | 1984 | 3779 | Making Telecommunications Measurements in Complex Impedances |
233-1 | 1981 | 1610A | Funtional Analysis of Signetics 2650 Microprocessor Systems Using the 1610A |
233-2 | ? | 1610A | Funtional Analysis of TMS 9900 Microprocessor Systems Using the 1610A |
233-3 | ? | 1610A | Funtional Analysis of Z80 Microprocessor Systems Using the 1610A |
233-4 | ? | 1610A | Funtional Analysis of 8080 Microprocessor Systems Using the 1610A |
233-5 | ? | 1610A | Funtional Analysis of 6800 Microprocessor Systems Using the 1610A |
233-6 | 1980 | 1610A-B | Functional Analysis of HP-1000 L-SeriesComputer Using the 1610A/B |
233-7 | 1980 | 1610A-B | Computer Performance Analysis Using the 1610A/B |
234-1 | 1977 | 8568A | 8568A Spectrum Analyzer Operation |
235 | ? | 654A-3320C | An Introduction to Balanced Circuits and Impedance Matching |
236-1 | 1977 | - | A "MAKE" or "BUY" Analysis for Power Supplies |
236-2 | 1979 | - | Two Power Supply Redundancy Schemes |
236-4 | 1981 | 65000 | EMI/RFI and HP 65000A Series Power Supplies - Meeting FCC and VDE Requirements for Computing Equipment |
238 | 1980 | 4140B | Semiconductor Measurements with the HP 4140B Picoammeter / DC Voltage Source |
238-1 | 1981 | 4140B-HP85 | Ultra Low Current Semiconductor DC Parameter Measurement System using HP 4140B |
240-0 | 1977 | 5420A | Analyse Numérique de Signaux (French Translation of AN 240-0) |
240-1 | ? | 5420A | Digital Signal Analysis - Feedback Control System Measurements |
240-1 | 1979 | 5420A | Analyse Numérique de Signaux - Mesure sur les Systèmes Asservies (French Translation of AN 240-1) |
240-2 | ? | 5420A | Improving the Accuracy of Structural Response Measurements |
240-2 | ? | 5420A | Amélioration de la Précision des Mesures de Réponse de Structures Mécaniques (French Translation of AN 240-2) |
243 | 1994 | 3582A | The Fundamentals of Signal Analysis |
243-1 | 1983 | 358X | Effective Machinery Maintenance Using Vibration Analysis |
243-1 | 1994 | 3562 | Effective Machinery Measurements Using Dynamic Signal Analyzers |
243-1 | 1983 | 358X | Maintenance de Machines par l'Analyse de Vibration (French Translation of AN 243-1) |
243-2 | 1991 | 3562 | Control System Development Using Dynamic Signal Analyzers |
243-2 | 1987 | 3562 | Measuring Switching Power Supply Stability with the HP 3562A (Supplement of AN 243-2) |
243-3 | 1992 | 3562 | The Fundamentals of Modal Testing |
243-4 | 1991 | 3562 | Fundamentals of the Z-Domain and Mixed Analog/Digital Measurements |
243-5 | 1992 | - | Control System Loop Gain Measurements |
243-6 | 1992 | 3562-3577 | Control System Measurement Fundamentals Using Dynamic Signal Analyzers and Accessories |
243-7 | 1995 | 358X | Bearing Runout Measurements |
245-1 | ? | 3582A | Signal Averaging with the 3582A Spectrum Analyzer |
245-2 | ? | 3582A | Measuring the Coherence Function with the 3582A Spectrum Analyzer |
245-3 | ? | 3582A | Third Octave Analysis with the 3582A Spectrum Analyzer |
245-4 | 1979 | 3582A | Accessing the 3582A Memory with HP-IB |
245-5 | 1979 | 3582A | Log Sweep with the 3582A Spectrum Analyzer |
246 | 1978 | 3585A | Using the HP 3585A Spectrum Analyzer with the HP 9825A Computing Controller |
246-1 | 1979 | 3585A | Optimizing the Dynamic Range of the HP 3585A Spectrum Analyzer |
246-2 | 1981 | 3585A | Measuring Phase Noise with the HP 3585A Spectrum Analyzer |
250-1 | 1978 | - | HP-IB / Power Supply Interface Guide |
250-2 | 1979 | - | Battery Charging / Discharging (Lab & Industrial Power Sources) |
260-1 | ? | 1615A | Understanding Hewlett-Packard's Model 1615A Logic Analyzer |
262 | 1978 | 1725A | Eliminating Time-Base Errors from Oscilloscope Measurements |
263 | ? | 10023A | Thermal Measurements of Electronic Components Using the Hewlett-Packard Temperature Probe |
270-1 | 1978 | 8568A | An Example of Automatic Measurement of Conducted EMI with the HP 8568A Spectrum Analyzer |
270-2 | 1980 | 8568A | Automated Noise Sideband Measurements Using the HP 8568A Spectrum Analyzer |
271-1 | 1978 | 1350A-9825A | Adding Soft Copy Graphics to 9825A Based HP-IB Systems Using the Model 1350A Graphic Translator |
272 | 1978 | 1743A | Precise Time Interval Measurements Using the Crystal Controlled Time Base Model 1743A Oscilloscope |
275 | 1979 | 1640A | Symptomatic Troubleshooting of Computer Networks with the HP 1640A |
275-1 | 1979 | 1640A | Using the HP 1640A Serial Data Analyzer with the Epitape Recorder |
275-2 | 1979 | 1640A | Using the HP 1640A Serial Data Analyzer with the Spectron T-511 Tape Unit |
276 | 1980 | 133X | Continuous Tone Imaging with Cathode-Ray Tube Displays |
280-1 | ? | 1602A | Making Complex Measurements with the HP Model 1602A Logic State Analyzer |
280-2 | 1978 | 1602A | Monitoring the IEEE-488 Bus with the 1602A Logic State Analyzer |
280-3 | 1978 | 1602A | The 1602A Logic State Analyzer As An Automatic Test Instrument |
280-4 | 1979 | 1602A | Using 1602A's for Measurements on Wide Buses in Manual and Automatic Modes |
281-1 | 1978 | HP1000 | Microprogramming - A Way to Get Higher Performance from HP 1000 Computers |
281-2 | 1978 | HP1000 | HP 1000 M-Series to E-Series Microprogram Conversion |
281-3 | 1978 | HP1000 | Using the HP 1000 E-Series Microprogrammable Processor Port |
282-1 | 1978 | 6940B | 6940B Multiprogrammer System Throughput Analysis for Multiprogrammer Systems Using the 9825A Desktop Computer |
283-1 | 1981 | 8662A | Applications and Measurements of Low Phase Noise Signals Using the 8662A Synthesized Signal Generator |
283-2 | 1979 | 11721A | External Frequency Doubling of the 8662A Synthesized Signal Generator |
283-3 | ? | 8662A-8663A | Low Phase Noise Applications of the HP 8662A and 8663A Synthesized Signal Generators |
285 | 1979 | 4904A-4930A | Successful Buried Cable Fault Locating |
286-1 | 1980 | 8901A | Applications and Operation of the 8901A Modulation Analyzer |
286-2 | 1981 | 8901A | Accurate Mixer/Amplifier Compression Measurement Using the 8901A Modulation Analyzer |
287-1 | ? | 5328A | Waveform Analysis Using the 5328A Universal Frequency Counter |
287-2 | ? | 5345A-5359A | Frequency Profile Using an HP 5345A Electronic Frequency Counter and an HP 5359A Time Synthesizer |
287-3 | ? | 5370A-5359A | Frequency Profile Using an HP 5370A Universal Time Interval Counter and an HP 5359A Time Synthesizer |
289 | 1979 | 8165A | A Stimulus for Automatic Test |
290 | 1980 | - | Practical Temperature Measurements |
290 | 1997 | - | Practical Temperature Measurements |
290-1 | 1987 | - | Practical Strain Gage Measurements |
290-2 | 1982 | 3497A | Using the HP 3497A to Control Industrial Wastewater Treatment |
290-2 | 1983 | 3497A | Utilisation du HP 3497A pour le contrôle-Commande du Traitement des Eaux Résiduaires Industrielles (French Translation of AN 290-2) |
291-1 | 1979 | 5345A-5355A | Application Guide to the 5355/56 Automatic Frequency Converter |
292 | 1979 | 1610A-HP1000 | Minicomputer Analysis Techniques Using Logic Analyzers |
292-1 | 1981 | 1610A-1615A | Funtional Analysis of the IEEE-488 Interface Bus |
293 | ? | 1611A | Funtional Analysis of Microprocessor Systems with the 1611A Option 001 General Purpose Module |
294 | 1979 | 8754A-9825A | Semi-Automatic R.F. Network Measurements Using the HP 8754A Network Analyzer and the HP 9825A Desktop Computer |
296 | 1980 | 8170A | An Apllications Guide for the 8170A Logic Pattern Generator |
296-1 | 1980 | 8170A | 8170A Logic Pattern Generator Simulates Multi-Channel Serial Data |
297-1 | 1981 | 8161A | 8161A Programmable Pulse Generator |
297-2 | 1981 | 8161A-5370A | 8161A Automated Reverse Recovery Time Measurements of Diodes |
298-1 | 1980 | 64000 | RS-232-C Communications with HP 64000 Logic Development System |
298-2 | 1981 | 64000 | Software Project Management with HP 64000 Logic Development System |
298-3 | 1981 | 64000 | Enhancing 64000 System Assemblers with Model 64851A User Definable Assembler |
298-4 | 1981 | 64000 | HP 64000 Logic Development System Microassemblers for Bit-slice Processors |
298-5 | 1980 | 64000 | Using HP 64000 with Logic Development System Computer Networks |
299 | 1980 | 1336A | Interfacing HP's Model 1336A Display to High-Resolution Imaging Systems |
300 | 1980 | 89XX-HP85 | High Performance Semi-Automatic Transceiver Testing |
301-1 | 1980 | 10544-10811 | Low Noise Division of 10 MHz Oscillators |
302-1 | 1980 | 4191A | Direct Radio Frequency Impedance Measurements Using the 4191A RF Impedance Analyzer |
302-2 | 1981 | 4191A | Impedance Characterization of High Q Devices from 1MHz to 1000MHz with 1Hz Resolution Using the 4191A RF Impedance Analyzer |
308-1 | 1980 | 3060A | Dynamic Digital Board Testing with the HP Model 3060A Option 100 |
309-1 | 1981 | 3060A | Static Digital Testing Using the HP 3060A Board Test System |
309-2 | 1981 | 3060A | Networking your Computer to the HP 3060A Board Test System |
311 | 1981 | - | Economics of IC Testing at Incoming Inspection |
312-1 | 1981 | 8350-8709 | Configuration of a Two-Tone Sweeping Generator 8350A/8620C Sweep Oscillators |
313-1 | ? | 5180A | Troubleshooting Microprocessor-Based Systems Using the 5180A Waveform Recorder and a Logic Analyzer |
313-2 | ? | 5180A-85XX | Teaming Up a 5180A Waveform Recorder and a Spectrum Analyzer for New Time-Domain Measurement Capabilities |
313-3 | ? | 5180A | Using the 5180A Waveform Recorder to Measure Microwave VCO Settling Time and Post Tuning Drift |
313-4 | ? | 5180A-5359A | Extending Frequency Range and Increasing Effective Sample Rate on the 5180A Waveform Recorder |
313-5 | ? | 5180A | Power Supply Testing with the 5180A Waveform Recorder |
313-6 | ? | 5180A-5359A | Recording Sonar and Other Signals Using the 5180A's Toggle Mode |
313-7 | ? | 5180A-3325A | Interconnecting Two or More 5180A Waveform Recorders to Obtain Multiple Input Channels |
313-8 | ? | 5180A-9826 | Using the Direct Memory Access Capability of the 5180A Waveform Recorder with the 9826 Desktop Computer |
313-9 | ? | 5180A-8112A | Using the 5180A Waveform Recorder to Evaluate Floppy Disc Media and Drive Electronics |
313-10 | 1988 | 5185A-5185T | HP 5181A Waveform Recorder - HP 5185T Digitizing Oscilloscope - Radar System Characterization and Testing |
313-11 | 1988 | 5185T | Using Digital Filtering Techniques to Improve Analog-to-Digital Converter Measurements |
314 | 1981 | 1741A | Variable-Persistence Aids Signal Display (Reprint from EDN Magazine) |
314-1 | 1986 | 8770S | Receiver Testing with the 8770S Arbitrary Waveform Synthesizer System |
314-2 | 1986 | 8770S | Synthesizing Magnetic Disc Read and Servo Signals with the HP 8770S Arbitrary Waveform Synthesizer System |
314-3 | 1986 | 8770S | Television Signal Simulation with the HP 8770S Arbitrary Waveform Synthesizer System |
314-4 | 1987 | 8770A-8780A | Exceptionally-Complex Signal Simulation for Multi-Signal Environments in Radar/EW Test |
314-5 | ? | 8780A-8791 | A Guide to Microwave Upconversion |
315 | 1985 | 4145A | DC Parametric Analysis of Semiconductor Devices |
315 | 1992 | 4145B | Practical Applications of the HP 4145B Semiconductor Parameter Analyzer - DC Parametric Analysis of Semiconductor Devices |
316-3 | 1982 | 6942A | High Speed FET Scanning with the 6942A Multiprogrammer |
317 | 1982 | 4193A-9845B | Practical Design and Evaluation of High Frequency Circuits Using the HP 4193A Vector Impedance Meter |
319 | 1982 | 818X | Parametric Characterization of Digital Circuits Up to 50 MHz |
322 | 1983 | 4280A | Analysis of Semiconductor Capacitance Characteristics Using the HP 4280A 1MHz C Meter / C-V Plotter |
323 | 1983 | 3746A | Detection of High Level Signals in FDM Networks |
324-1 | 1983 | 445XX | Understanding Your Bed-of-Nails Test Fixture |
325-2 | ? | 5528A | Machine Tool Calibration - Laser Measurement System 5528A - HP85 |
325-12 | 1990 | 5517B-10705A | Non-Contact Measurements with Laser Interferometers |
326 | 1986 | - | Principles of Microwave Connector Care (For Higher Reliability and Better Measurements) |
328-1 | 1983 | 3488A ++ | Practical Test System Signal Switching |
329 | 1983 | 86XX-83XX | Performance Characteristics of HP Microwave Signal Sources - A Comparison |
329 | 1986 | 86XX-83XX | Microwave Signal Sources Spectral Purity Characteristics of HP Microwave Signal Sources |
330-1 | 1985 | 8566-9836 | Automatic MIL-STD EMI Testing Using the HP 85864A/B EMI Measurement Software |
331-1 | 1986 | 8566-85650A | Automatic CISPR EMI Testing For Conductef Emissions Using the HP 85864A/B EMI Measurement Software |
332 | 1984 | 11713A-333XX | Microwave Switching From SPDT to Full Access Matrix |
333 | 1984 | 3054A | Monitoring of a Solar Collector and Heat Reclamation Heating System |
334 | 1984 | 4063A | Automation of Semiconductor Parameter Analysis - Practical Applications of the HP 4063A Semiconductor Parameter Analysis System |
339 | 1985 | 4194A | Parametric Analysis for Electronic Components and Circuit Evaluation Using the 4194A Impedance / Gain-Phase Analyzer |
339-1 | 1985 | 4194A | Impedance Characterisation of Resonators Using the 4194A Impedance / Gain-Phase Analyzer |
339-2 | 1986 | 4194A | Characteristic Impedance Measurement of PC Board Circuit Patterns - HP 4194A Application Information |
339-3 | 1986 | 4194A | Crosstalk and Impedance Measurements of PC Board Patterns - HP 4194A Application Information |
339-4 | 1986 | 4194A | Measuring the Characteristic Impedance of Balanced Cables - HP 4194A Application Information |
339-5 | 1986 | 4194A | Multi-Frequency C-V Measurements and Doping Profile Analysis of Semiconductors - HP 4194A Application Information |
339-6 | ? | 4194A | Static Head Testing of Disk Drives - HP 4194A Application Information |
339-7 | 1987 | 4194A | Efficient Evaluation of LISNs and Voltage Probes for EMI Tests - HP 4194A Impedance / Gain-Phase Analyzer |
339-8 | 1987 | 4194A | Constant Current Measurements Using the HP 4194A - HP 4194A Impedance / Gain-Phase Analyzer |
339-9 | 1987 | 4194A | Negative Impedance Measurements of Crystal Oscillators - HP 4194A Impedance / Gain-Phase Analyzer |
339-10 | 1987 | 4194A | Input / Output and Reflection Coefficient Measurements - HP 4194A Impedance / Gain-Phase Analyzer |
339-11 | 1987 | 4194A | Filter Test for Production and Incoming Inspection - HP 4194A Impedance / Gain-Phase Analyzer |
339-13 | 1987 | 4194A | Measuring the dielectric Constant of Solid Materials - HP 4194A Impedance / Gain-Phase Analyzer |
339-14 | 1988 | 4194A | Testing Switching Power Supplies Using the HP 4194A |
339-20 | 1987 | 414X | Role of DC Parametric Test in High Speed Digital and Microwave Semiconductor Component Manufacturing |
340-1 | 1990 | - | Reducing Fixture-Induced Test Failures |
341-1 | ? | 1630G-8175A | Testing a Complex LSI / VLSI IC with a Low-Cost Measurement Set-UP |
341-2 | ? | 8175A | Simulating Sensor Signals - Calibrating and Testing an IR Detecting System with the HP 8175A |
343-1 | 1986 | 8780A-8980A | Vector Modulation Measurements - Measurement Applications for Digital Microwave Radio |
343-2 | 1988 | 8780A-8981A | Dynamic Component Test Using Vector Modulation Analysis |
343-3 | 1986 | 8780A-8980A | Vector Modulation Measurements - Coherent Pulsed Tests of Radar and Electronic Warfare Systems |
343-4 | 1987 | 8980A | Measuring Demodulator Image Rejection Using the HP 8980A Vector Analyzer |
343-5 | 1988 | 8780A-8770A | Calibrated Microwave System for Complex Arbitrary Signal Simulation Using HP 8780A and HP 8770A Arbitrary Waveform Synthesizer |
343-6 | 1989 | 878X-3708A | Testing Digital Microwave Receivers Using a Calibrated Source |
344 | 1986 | 54100A-D | Bandwidth and Sampling Rate in Digitizing Oscilloscopes |
345-1 | 1986 | 8757A ++ | Amplifier Measurements Using the Scalar Network Analyzer |
345-1 | 2001 | 8757A ++ | Microwave Component Measurements - Amplifier Measurements Using the Scalar Network Analyzer |
345-2 | 1987 | 8757A ++ | Mixer Measurements Using the Scalar Network Analyzer |
346 | 1986 | 41XX-42XX | A Guideline for Designing External DC Bias Circuits for the HP 4192A, 4194A, 4274A, 4275A, 4276A, 4277A |
346-2 | 1992 | 4194A-4195A | Balanced Circuit Measurement wth an Impedance Meter / LCR Meter / Network Analyzer |
346-3 | 1992 | 4285A | Effective Impedance Measurement Using OPEN / SHORT / LOAD Correction |
346-4 | 1999 | 42XX | 8 Hints for Successful Impedance Measurements |
348 | 1986 | - | Voltage and Time Resolution in Digitizing Oscilloscopes |
349 | 1986 | - | PC Instruments Applications Handbook - Explore Ways to Improve Your Test and Measurement Productivity |
351 | 1987 | 8753A | Characterization of High-Speed Optical Components with an RF Network Analyzer |
355A | 1992 | 37XX | Digital Radio Theory and Measurements |
355-1 | 1992 | 37XX-8590A | A Description of the Wide Range of Test Solutions Available From HP for Digital Radio Test |
356 | 1987 | 4142B-S300 | HP 4142B Modular DC Source / Monitor Practical Applications - High Speed DC Characterisation of Semiconductor Devices Sub pA to 1A |
356-1 | 1988 | 4142B-S300 | HP 4142B Modular DC Source / Monitor Practical Applications - Techniques and Applications for High Throughput and Stable Characterization |
357-3 | 1988 | 4195A | Advanced Filter Evaluation and Limit Testing with HP 4195A Network / Spectrum Analyzer |
357-4 | 1989 | 4195A | Testing Magnetic Disk Read Circuits Using the HP 4195A |
358-1 | 1987 | 5371A | HP 5371A Frequency and Time Interval Analyzer - Characterization of Frequency-Agile Signal Sources |
358-2 | 1987 | 5371A | HP 5371A Frequency and Time Interval Analyzer - Jitter and Wander Analysis in Digital Communications |
358-3 | 1988 | 5371A | HP 5371A Frequency and Time Interval Analyzer - Time Domain Characterization of Magnetic Disk Drives |
358-4 | 1989 | 5372A | HP 5372A Frequency and Time Interval Analyzer - Pre-Trigger Simplifies VCO Step Response Measurements |
358-5 | 1989 | 5372A | HP 5372A Frequency and Time Interval Analyzer - Clock Rate Independent Jitter Measurements for Digital Communications Systems |
358-5 | 1990 | 5372A | Mesure de Gigue Indépendante de la Vitesse d'Horloge pour les Systèmes de Transmission Numériques (French Translation of AN 358-5) |
358-6 | 1989 | 5372A | HP 5372A Frequency and Time Interval Analyzer - Characterizing Transient Timing Errors in Disk and Tape Drives |
358-7 | 1989 | 5372A | HP 5372A Frequency and Time Interval Analyzer - Analysing Phase-Locked Loop Transients in the Modulation Domain |
358-8 | 1989 | 5372A | HP 5372A Frequency and Time Interval Analyzer - Single Shot BPSK Signal Characterization |
358-9 | 1989 | 5372A | HP 5372A Frequency and Time Interval Analyzer - Modulation Domain Techniques for Measuring Complex Radar Signals |
358-9 | 1991 | 5372A | Technique de Mesure de Signaux Radar Complexes dans le Domaine de Modulation (French Translation of AN 358-9) |
358-10 | 1989 | 5372A | HP 5372A Frequency and Time Interval Analyzer - Characterizing Baker Coded Modulation in Radar Systems |
358-11 | 1989 | 5372A | HP 5372A Frequency and Time Interval Analyzer - Characterizing Shirp Coded Modulation in Radar Systems |
358-12 | 1990 | 5371A-5372A | Simplifiez les Mesures de Stabilité en Fréquence à l'Aide de l'Analyse de Variance d'Allan Intégrée (French Translation of AN 358-12) |
358-13 | 1990 | 5372A | Analysing Phase-Locked Loop Capture and Tracking Range |
360 | 1987 | 378X | Jitter Tolerance Testing Using Phase or Frequency Modulated Sources and Bit Error Rate Test Sets |
361 | 1988 | 815X | Traceability of Optical Power Measurements - How Traceability to National Standards is Provided by Hewlett-Packard |
362 | 1988 | 815X-3764A | Bit Error Rate Measurements on Optical Fiber Systems |
364-2 | 1990 | 3709B | Digital Radio Testing with British Telecom |
366-1 | 1986 | 815X-8145A | How to Measure Insertion Loss of Optical Components |
366-2 | 1988 | 815X | How to Measure Return Loss of Optical Components |
366-3 | 1988 | 8145A | How to Measure Return Loss in Optical Links Using the HP 8145A OTDR |
369-1 | 1988 | 4284A | Optimizing Electronic Component and Material Impedance Measurements Taking Full Advantage of the HP 4284A Precision LCR Meter |
369-2 | 1988 | 4284A | Tantalum Electrolytic Capacitor Measurements in Production and Quality Control Departments - HP 4284A Precision LCR Meter |
369-3 | 1988 | 4284A | Impedance Measurements of Magnetic Heads Using Constant Current in Production and Quality Control Departments |
369-4 | 1988 | 4284A | Recommending Electronic Manufacturers to Perform Incomming Inspection - HP 4284A Precision LCR Meter |
369-5 | 1988 | 4284A | Multi-Frequency C-V Measurements of Semiconductors - HP 4284A Precision LCR Meter |
369-6 | 1988 | 4284A | Impedance Testing Using Scanner - HP 4284A Precision LCR Meter |
369-7 | 1988 | 4284A | Measurement of Capacitance Characteristics of Liquid Crystal Cell with HP 4284A Precision LCR Meter |
369-8 | 1989 | 4284A-42841A | Wide Range DC Current Biased Inductance Measurement with HP 4284A Precision LCR Meter / HP 42841A Bias Current Source |
369-9 | 1989 | 4284A-4285A | Improve Electronic Product Quality and Performance with HP Precision LCR Meters - HP 4284A and HP 4285A Precision LCR Meters |
371 | 1992 | 71400 | HP 71400 Lightwave Signal Analyzer - Measuring Modulated Light |
372-1 | 1988 | 60XX | Power Supply Testing |
372-2 | 1988 | 60XX | Battery Testing |
372-3 | 1988 | 60XX-66XX | Power Components Testing |
374-1 | 1988 | 8510B-8340B | Antenna Measurements - Manual Pattern Measurements Using the HP 8510B |
376-1 | 1988 | 662X | Biasing Three-Terminal Devices for Test - A precise Solution for Component Evaluation and Sub-Assembly Testing… |
377-1 | 1989 | 5361A | Automatic Frequency Profiling of Chirped Radar Pulses Using the HP 5361A 20 GHz Pulse / CW Microwave Counter |
377-2 | 1989 | 5361A | Automatic Characterization of Microwave VCO's Using the HP 5361A 20 GHz Pulse / CW Microwave Counter |
377-3 | 1989 | 5361A | Frequency Profiling Without a Pulse Generator Using the HP 5361A 20 GHz Pulse / CW Microwave Counter's Built-In Profiling |
377-4 | 1990 | 5361B | Frequency and Phase Profiling Simplified with the HP 5361B Pulse / CW Microwave Counter |
378-1 | 1989 | 3585B | Harmonic Distorsion Measurements - Enhancing Speed and Performance with Spectrum Analysis |
379-1 | 1989 | 11757A | Measuring Digital Microwave Radio M-Curves / Signatures |
379-2 | 1990 | 11758T | Measuring Microwave Radio Antenna Return Loss Using the HP 11758T Digital Radio Test System |
380-1 | 1989 | 16451B | Dielectric Constant Measurement of Solid Materials Using the HP 16451B Dielectric Test Fixture |
380-2 | 1990 | 4195A-4284A | Measuring Cable Parameters - HP Precision LCR Meters and Impedance Analyzers |
380-3 | 1995 | - | Evalution of Colloids by Dielectric Spectroscopy |
381 | 1989 | 5412X-8131A | A Test Setup for Characterizing High-Speed Logic Devices |
381 | 1990 | 5412X-8131A | Configuration de Test pour la Caractérisation des Composants Logiques rapides (French Translation of AN 381) |
381-1 | 1990 | 5412X-8131A | Configuration de Test pour la Caractérisation d'un Trigger de Schmitt rapide (French Translation of AN 381-1) |
383-1 | 1989 | 4142B | Simplification of DC Characterization and Analysis of Semiconductor Devices |
383-2 | 1990 | 4142B | Automation of DC Characterization and Analysis of Semiconductor Devices |
385 | 1989 | 3048A | Millimeter Measurements Using the HP 3048A Phase Noise Measurement System |
386 | 1990 | 3048A | Pulsed Carrier Phase Noise Measurements Using the HP 3048A Phase Noise Measurement System |
387 | 1990 | 378X-37721A | High Productivity Measurements in Digital Transmission |
388 | 1990 | - | Signal Generator Spectral Purity |
392-1 | 1990 | 165XX | How the Right Preprocessor Interface Can Simplify Logic Analysis - Aerospace and Defense Applications |
392-2 | 1990 | 165XX | How the Right Preprocessor Interface Can Simplify Logic Analysis - PC and PC Add-On Applications |
392-3 | 1990 | 165XX | How the Right Preprocessor Interface Can Simplify Logic Analysis - VME / VXI Applications |
392-4 | 1990 | 165XX | How the Right Preprocessor Interface Can Simplify Logic Analysis - Workstation / Server Applications |
392-5 | 1990 | 165XX | How the Right Preprocessor Interface Can Simplify Logic Analysis - Computer Peripheral Applications |
392-6 | 1990 | 165XX | How the Right Preprocessor Interface Can Simplify Logic Analysis - Industrial / Automotive Applications |
393 | 1990 | 3562A | Monitoring of Ultrasonic Wire Bonding Machines |
397-1 | 1990 | 4951X-4952A | ISDN Testing Techniques for the HP 4954I and the HP 4951C / HP 4952A WAN Protocol Analyzers |
398-2 | 1990 | - | Correlation of Timing Measurements |
399 | 1990 | 4972A | Problem Isolation Techniques for Ethernet 802.3 Local Area Networks |
401 | ? | - | The AN 401 Series - HP 1000/HP-IB programming Application Notes |
401-1 | ? | HP1000 | HP 1000/HP-IB Programming Proceedures 5953-2800 |
401-2 | ? | HP1000-59307 | 59307 VHF Switch - HP-IB - HP 1000 Computer Programming Guide 5953-2801 |
401-3 | 1979 | HP1000-5345A | 5345A Electronic Counter - HP-IB - HP 1000 Computer Programming Guide 5953-2802 |
401-4 | 1979 | HP1000-5342A | 5342A Microwave Frequency Counter - HP-IB - HP 1000 Computer Programming Guide 5953-2803 |
401-5 | ? | HP1000-5328A | 5328A Counter - HP-IB - HP 1000 Computer Programming Guide 5953-2804 |
401-6 | ? | HP1000-3438A | 3438A Digital Multimeter - HP-IB - HP 1000 Computer Programming Guide 5953-2805 |
401-7 | 1979 | HP1000-3455A | 3455A Digital Voltmeter - HP-IB - HP 1000 Computer Programming Guide 5953-2806 |
401-8 | ? | HP1000-59309A | 59309A Digital Clock - HP-IB - HP 1000 Computer Programming Guide 5953-2807 |
401-9 | ? | HP1000-6002A | 6002A Power Supply - HP-IB - HP 1000 Computer Programming Guide 5953-2808 |
401-10 | ? | HP1000-3437A | 3437A Digital Voltmeter - HP-IB - HP 1000 Computer Programming Guide 5953-2809 |
401-11 | ? | HP1000-3495A | 3495A Scanner - HP-IB - HP 1000 Computer Programming Guide 5953-2810 |
401-12 | ? | HP1000-3582A | 3582A Spectrum Analyzer - HP-IB - HP 1000 Computer Programming Guide 5953-2811 |
401-13 | ? | HP1000-3325A | 3325A Function Generator - HP-IB - HP 1000 Computer Programming Guide 5953-2812 |
401-14 | ? | HP1000-4262A | 4262A Digital LCR Meter - HP-IB - HP 1000 Computer Programming Guide 5953-2813 |
401-15 | 1979 | HP1000-8672A | 8672A Synthesized Signal Generator - HP-IB - HP 1000 Computer Programming Guide 5953-2814 |
401-16 | 1979 | HP1000-436A | 436A Microwave Power Meter - HP-IB - HP 1000 Computer Programming Guide 5953-2815 |
401-17 | ? | HP1000-8620C | 8620C Sweep Oscillator - HP-IB - HP 1000 Computer Programming Guide 5953-2816 |
401-18 | ? | HP1000-59306A | 59306A Relay Actuator - HP-IB - HP 1000 Computer Programming Guide 5953-2817 |
401-19 | ? | HP1000-8660C | 8660C Synthesized Signal Generator - HP-IB - HP 1000 Computer Programming Guide 5953-2818 |
401-20 | ? | HP1000-9871A | 9871A Character Impact Printer - HP-IB - HP 1000 Computer Programming Guide 5953-2819 |
401-21 | ? | HP1000-6942A | 6942A Multiprogrammer II - HP-IB - HP 1000 Computer Programming Guide 5953-2820 |
417-1 | 1986 | 9000-S200-S300 | HP Basic I/O Concepts for the HP 9000 Series 200 and Series 300 |
421-1 | 1987 | 3852-S300-1000 | Data Aquisition & Computer Aided Test Applications Summary Series - Commercial Energy Conservation |
421-2 | 1987 | 3852-S300-1000 | Data Aquisition & Computer Aided Test Applications Summary Series - Fan Testing |
421-3 | 1987 | 3852-S300-1000 | Data Aquisition & Computer Aided Test Applications Summary Series - Vehicle Body Testing |
421-4 | 1987 | 3852-S300-1000 | Data Aquisition & Computer Aided Test Applications Summary Series - Wastewater Treatment |
421-5 | 1987 | 3852-S300-1000 | Data Aquisition & Computer Aided Test Applications Summary Series - Jet Engine Controler Testing |
421-6 | 1987 | 3852-S300-1000 | Data Aquisition & Computer Aided Test Applications Summary Series - Internal Combustion Engine Testing |
421-7 | 1987 | 3852-S300-1000 | Data Aquisition & Computer Aided Test Applications Summary Series - Environmental / Autoclave Testing |
421-8 | 1987 | 3852-S300-1000 | Data Aquisition & Computer Aided Test Applications Summary Series - Communication Cable Testing |
421-9 | 1987 | 3852-S300-1000 | Data Aquisition & Computer Aided Test Applications Summary Series - Residential Facility Testing |
421-10 | 1987 | 3852-S300-1000 | Data Aquisition & Computer Aided Test Applications Summary Series - Canning Process Characterization |
421-11 | 1987 | 3852-S300-1000 | Data Aquisition & Computer Aided Test Applications Summary Series - Explosion Testing |
421-12 | 1987 | 3852-S300-1000 | Data Aquisition & Computer Aided Test Applications Summary Series - Materials Development |
421-13 | 1987 | 3852-S300-1000 | Data Aquisition & Computer Aided Test Applications Summary Series - Plating Line Control |
421-14 | 1987 | 3852-S300-1000 | Data Aquisition & Computer Aided Test Applications Summary Series - Battery Testing |
421-15 | 1987 | 3852-S300-1000 | Data Aquisition & Computer Aided Test Applications Summary Series - Pilot Plant Monitoring |
421-16 | 1987 | 3852-S300-1000 | Data Aquisition & Computer Aided Test Applications Summary Series - Jet Engine Testing |
421-17 | 1987 | 3852-S300-1000 | Data Aquisition & Computer Aided Test Applications Summary Series - Facility Management |
421-18 | 1987 | 3852-S300-1000 | Data Aquisition & Computer Aided Test Applications Summary Series - "Large Product" Characterization |
421-19 | 1987 | 3852-S300-1000 | Data Aquisition & Computer Aided Test Applications Summary Series - Missile System Testing |
421-20 | 1987 | 3852-S300-1000 | Data Aquisition & Computer Aided Test Applications Summary Series - Machine Monitoring Control |
421-21 | 1987 | 3852-S300-1000 | Data Aquisition & Computer Aided Test Applications Summary Series - Pharmaceutical Process Control |
421-22 | 1987 | 3852-S300-1000 | Data Aquisition & Computer Aided Test Applications Summary Series - Paper Process Characterisation |
421-23 | 1987 | 3852-S300-1000 | Data Aquisition & Computer Aided Test Applications Summary Series - Rolling Mill |
421-24 | 1987 | 3852-S300-1000 | Data Aquisition & Computer Aided Test Applications Summary Series - Appliance Testing |
421-25 | 1987 | 3852-S300-1000 | Data Aquisition & Computer Aided Test Applications Summary Series - Airframe Testing |
421-26 | 1987 | 3852-S300-1000 | Data Aquisition & Computer Aided Test Applications Summary Series - On-Road Vehicle Testing |
421-27 | 1987 | 3852-S300-1000 | Data Aquisition & Computer Aided Test Applications Summary Series - Pumping Station Control |
421-28 | 1987 | 3852-S300-1000 | Data Aquisition & Computer Aided Test Applications Summary Series - Receiver Testing |
421-29 | 1987 | 3852-S300-1000 | Data Aquisition & Computer Aided Test Applications Summary Series - Bed-of-Nails Testing for Digital to Analog Converters |
421-30 | 1987 | 3852-S300-1000 | Data Aquisition & Computer Aided Test Applications Summary Series - Environmental Test of Automotive Radios and Engine Controllers |
421-31 | 1987 | 3852-S300-1000 | Data Aquisition & Computer Aided Test Applications Summary Series - Sonar System Testing |
421-32 | 1987 | 3852-S300-1000 | Data Aquisition & Computer Aided Test Applications Summary Series - Environmental Test of Electronic Subassemblies |
425 | 1990 | 4951C-4952A | Le Contrôle et l'Entretien de Votre Réseau X,25 (French Translation of AN 425) |
426 | 1989 | 9000-S300 | File Sharing Between HP BASIC/WS, HP BASIC/UX, and HP-UX for HP 9000 Series 300 Computers |
907 | 1967 | - | The Hot Carrier Diode - Theory, Design and Application |
909 | 1966 | - | Electrical Isolation Using the HPA 4310 |
910 | 1968 | - | Optoelectronic Coupling for Coding, Multiplexing and Channel Switching |
911 | ? | - | Low Level DC Operation Using HP Photochoppers |
912 | ? | - | An Attenuator Design Using PIN Diodes - Constant Impedance Current Controlled 10 MHz to 1,0 GHz Bandwidth |
913 | 1967 | - | Step Recovery Diode Frequency Multiplier Design |
914 | 1967 | - | Biasing and Driving Considerations for PIN Diode RF Switches and Modulators |
915 | 1967 | - | Threshold Detection of Visible and Infrared Radiation with PIN Photodiodes |
916 | 1967 | - | HPA GaAs Sources |
917 | 1967 | - | HPA PIN Photodiode |
918 | 1968 | - | Pulse and Waveform Generation with Step Recovery Diodes |
919 | 1968 | - | Optmizing Signal-to-Noise Ratio in Photochopper Applications |
920 | 1968 | - | Harmonic Generation Using Step Recovery Diodes and SRD Modules |
921 | ? | - | The 33800 Series Mixer / Detector Module |
922 | ? | - | Applications of PIN Diodes |
923 | ? | - | Hot Carrier Diode Video Detectors |
928 | ? | - | Ku-Band Step Recovery Multiplier |
929 | ? | - | Fast Switching PIN Diodes |
930 | 1970 | - | Handling and Assembling HP Transistor Chips |
931 | 1970 | - | Solid State Alphanumeric Display - Decoder / Driver Circuitry |
932 | 1974 | - | Selection and Use of Microwave Diode Switches and Limiters |
933 | 1970 | - | Monolithic Solid State Seven Segment Displays |
935 | 1971 | - | Microwave Power Generation and Amplification Using Impatt Diodes |
936 | 1971 | - | High Performance PIN Attenuator for Low Cost AGC Applications |
938 | ? | - | Solid State Lamp Installation Note |
942 | 1973 | - | Shottky Diodes for High Volume, Low Cost Applications |
944-1 | 1973 | - | Microwave Transistor Bias Considerations |
1006 | 1980 | LED-DISPLAY | Seven Segment LED Display Applications |
1011 | 1984 | - | Conception et Mise en Œuvre des Codeurs Incrémentiels HEDS-5000 et HEDS-6000 |
1025 | 1985 | - | Applications and Circuit Design for the HEDS-7000 Series Digital Potentiometer |
1034 | 1988 | 815X | How to Make Accurate Fiber Optic Power Measurements |
1200-1 | 1990 | 53310A | HP 53310A Modulation Domain Analyzer - Simplified Motor Spin-Up Analysis |
1200-2 | 1990 | 53310A | HP 53310A Modulation Domain Analyzer - Direct Characterization of Motion Control Systems |
1200-3 | 1990 | 53310A | HP 53310A Modulation Domain Analyzer - VCO Step Response Analysis Made Easy |
1200-4 | 1990 | 53310A | HP 53310A Modulation Domain Analyzer - Quick Identification of Periodic Jitter Sources |
1200-5 | 1990 | 53310A | HP 53310A Modulation Domain Analyzer - Fast Characterization of Pulse Width Encoded Data |
1200-6 | 1990 | 53310A | HP 53310A Modulation Domain Analyzer - Simple Analysis of Frequency Modulation |
1200-7 | 1990 | 53310A | HP 53310A Modulation Domain Analyzer - Simplified Analysis of Phase-Locked Loop Capture and Tracking Range |
1200-8 | 1990 | 53310A | HP 53310A Modulation Domain Analyzer - Single Shoot Frequency Profiling of Chirped Radars Made Easy |
1200-9 | 1990 | 53310A | HP 53310A Modulation Domain Analyzer - Histograms Simplify Analysis of Random Jitter |
1200-10 | 1990 | 53310A | HP 53310A Modulation Domain Analyzer - Examine Channel Switching Characteristics of Cellular Radios |
1200-11 | 1993 | 53310A | HP 53310A Modulation Domain Analyzer - Examine GMSK Modulation in GSM and PCN Mobile Communications Systems |
1200-12 | 1991 | 53310A | HP 53310A Modulation Domain Analyzer - Peak Deviation and Center Frequency Measurements for CT2 and DECT Radios |
1202-1 | 1990 | 8751A | HP 8751A Network Analyzer 5Hz to 500MHz - Designing Impedance Matching Networks with the HP 8751A |
1202-2 | 1991 | 8751A | HP 8751A Network Analyzer 5Hz to 500MHz - 17 Fixtures, Test Sets and Accessories for the HP 8751A |
1202-3 | 1991 | 8751A | HP 8751A Network Analyzer 5Hz to 500MHz - 3 Steps to Better Baseband, IF and RF Design with the HP 8751A |
1205 | 1991 | 4142B | Efficient Microwave Bias and Test Using the HP 4142B Modular DC Source / Monitor |
1206-1 | 1991 | HP Vee | Complete Data Acquisition Solutions with HP VEE-Test |
1206-2 | 1991 | HP Vee | Design Characterization Using HP VEE-Test |
1207-1 | 1991 | 823XX | Multiprocessing with HP Measurement Coprocessors |
1207-2 | 1991 | 823XX | Installing Multiple HP Measurement Coprocessors |
1210-1 | 1991 | 4194A | Characterizing IC Packages with Impedance Measurements and the UTP-3000 Test Fixture |
1210-3 | 1991 | 813X | Simulating Noise Signals for Tolerance Testing |
1210-5 | 1991 | 54121T | Characterizing IC Packages with TDR / TDT and the UTP-3000 Test Fixture |
1210-6 | 1991 | 5412X-8131A | Characterizing Jitter with a Digitizing Oscilloscope |
1210-10 | 1992 | 54720A-8133A | Timing Considerations in Clock Distribution Networks |
1210-11 | 1992 | 8510-87XX | Simulation and Optimization Methods for MCM Substrates |
1210-14 | 1992 | 4194A-875X | Electrical Characterization Methods for MCM Substrates |
1210-16 | 1994 | - | Characterizing the Performance of High-Speed Digital-to-Analog Converters |
1211-1 | 1991 | 37722-37732 | Standard and CRC-4 Frame Testing |
1211-2 | 1991 | 377XX | Testing N x 64 Kb/s Services |
1211-3 | 1991 | 377XX | Testing Sub-Rate Data Services |
1213 | 1991 | 3588A-3589A | Better Noise Measurements with the HP 3588A & HP 3589A |
1214 | 1991 | 54510A | Sequential Single-Shot Optimizes Speed, Memory Depth and Throughput |
1216-1 | 1992 | 4142B | Performing High-Speed Parameter Extractions on High-Power Devices Using the HP 4142B Modular DC Source / Monitor |
1216-2 | 1992 | 4142B | An Automated DC Parameter Measurement System for Power Modules and Smart Power ICs Using the HP 4142B Modular DC Source / Monitor |
1217-1 | 1992 | 419X-875X | Basics of Measuring the Dielectric Properties of Materials |
1218-1 | 1992 | 7145X | Optical Spectrum Analysis Basics |
1219-1 | 1992 | 82335B | HP 82335B HP-IB for Windows - Utilizing DDE for Test and Measurement Applications |
1219-2 | 1992 | 82335B | HP 82335B HP-IB for Windows - Creating Instrument Control Applications with Visual Basic and HP-IB for Windows |
1219-3 | 1992 | 82335B | HP 82335B HP-IB for Windows - Creating Software Front Panels for Your VXI Instruments |
1221 | 1992 | 54701A | Differential Measurements on Wideband Signals |
1223 | 1992 | 16550A | Logic Analyzer Triggering Applications for the HP 16550A 100 MHz State / 500 MHz Timing Module |
1224-1 | 1992 | 4338A-4339A | Contact Resistance and Insulation Resistance Measurements of Electro-Mechanical Components |
1224-2 | 1992 | 4339A | Insulation Resistance Measurements of the Plate Type Materials |
1224-3 | 1992 | 4263A | Effective Transformers / LF Coils Testing |
1224-4 | 1992 | 4263A | Effective Electrolytic Capacitors Testing |
1225-1 | 1992 | 16542A | Imaging and DSP Testing with the HP 16542A |
1225-2 | 1992 | 16542A | Cache Hit or Miss Analysis with the HP 16542A |
1225-3 | 1992 | 16542A | Digital Video Testing with the HP 16542A |
1225-4 | 1992 | 16542A | Analog-to-Digital Converter Testing with the HP 16542A |
1230 | 1992 | 35665A | Sound Power Measurements |
1237-1 | 1993 | - | Maximizing Revenue with In-Service Testing-Introduction |
1241 | 1993 | 54720-1143A | Microprobing with the Fine-Pitch Active Probe |
1242 | 1992 | - | Microprobing Essentials for Fine Pitch Modules |
1245 | 1993 | 16500X | PC Network Connectivity with the HP 16500L Interface Module |
1246 | 1993 | 6060B | Pulsed Characterization of Power Semiconductors Using Electronic Loads |
1253 | 1994 | VXI | Real-Time System Measures Aircraft Flight Characteristics |
1260-1 | 1993 | 4396A | Combining Network and Spectrum Analysis and IBASIC to Improve Device Characterization and Test Time |
1266-1 | 1994 | 16500X | Intel 80960CA Software Debug Using a Logic Analyzer and an In-Circuit Debugger |
1267 | 1995 | 71501B-703XX | Frequency Agile Jitter Measurement System |
1270-1 | 1995 | VXI ++ | Final Test and Alignment for Cellular Phones & Failure Analysis and Repair for Cellular Phones |
1270-2 | 1995 | VXI ++ | VHF Transceiver Testing |
1270-3 | 1995 | VXI ++ | Prototype Aircraft Jet Engine Characterization and Test |
1270-4 | 1995 | VXI ++ | Electronic Heater Valves Testing |
1270-5 | 1995 | VXI ++ | Vehicle Body Testing |
1270-6 | 1995 | VXI ++ | On Road Vehicle Testing |
1270-7 | 1995 | VXI ++ | Communication Cable Testing |
1270-8 | 1995 | VXI ++ | Airframe Testing |
1270-9 | 1995 | VXI ++ | Jet Engine Controller Testing |
1270-10 | 1995 | VXI ++ | Jet Engine Testing |
1270-11 | 1995 | VXI ++ | Environmental Test of Automotive Radios and Engine Controllers |
1270-12 | 1995 | VXI ++ | Automotive Relay Modules Testing |
1272 | 1996 | 58503A-59551A | GPS and Precision Timing Applications |
1273 | 1995 | 6840 | Compliance Testing to the IEC 1000-3-2 (EN 61000-3-2) and IEC 1000-3-3 (EN 61000-3-3) Standards |
1279 | 1996 | 5071A-58503A | HP SmartClock Technology - Improving Oscillator Long-Term Stability for Synchronization Applications |
1279 | 1998 | 5071A-58503A | HP SmartClock Technology - Improving Oscillator Long-Term Stability for Synchronization Applications |
1286-1 | 1997 | 856X-859X | 8 Astuces pour Améliorer vos Analyses de Spectre (French Translation of AN 1286-1) |
1287-1 | 1997 | 87XX | Understanding the Fundamental Principles of Vector Network Analysis |
1287-2 | 1997 | 87XX | Exploring the Architectures of Network Analyzers |
1287-3 | 1997 | 87XX | Applying Error Correction to Network Analyzer Measurements |
1287-4 | 1997 | 87XX | Network Analyzer Measurements: Filter and Amplifier Examples |
1287-7 | 1998 | 87XX | Improving Network Analyzer Measurements of Frequency-Translating Devices |
1288-1 | 1997 | 4396B | Combining Network and Spectrum Analyses and IBASIC to Improve Device Characterization and Test Time |
1288-2 | 1994 | 4396B | Configuring the HP 4396B for Optical / Electrical Testing |
1288-4 | 1997 | 4396B | How to Characterize CATV Amplifiers Effectively |
1289 | 1997 | - | The Science of TimeKeeping |
1291-1 | 1997 | 87XX-8510 | 8 Hints for Making Better Network Analyzer Measurements |
1293 | 1997 | E435X | Sequential Shunt Regulation - Regulating Satellite Bus Voltage |
1296 | 1997 | - | LMDS - The Wireless Interactive Broadband Access Service |
1297 | 1997 | 42XX-43XX-87XX | Solution for Measuring Permittivity and Permeability - Meeting Tomorrow's Material Test Challenges |
1298 | 1997 | - | Digital Modulation in Communications Systems - An Introduction |
1299 | 1997 | 37778A-71451B | Introduction to BER Testing of WDM Systems |
1303 | 1998 | 859X-856X | Spectrum Analyzer Measurements and Noise - Measuring Noise and Noise-Like Digital Communications Signals with a Spectrum Analyzer |
1304-2 | 1988 | 54750A-83480A | Time Domain Reflectometry Theory |
1304-4 | 2000 | 54750A | Measuring Characteristic Impedance of Short RAMBUS Motherboard Traces and Small-Outline RIMM's |
1307 | 1998 | 87XX-85XX | Testing CDMA Base Station Amplifiers - Measurements Fundamentals of Characterizing the Linear and Non-Linear Behavior of CDMA Amplifiers |
1308-1 | 1998 | 4395A-4396A | Network, Spectrum, and Impedance Evaluation of Electronic Circuits and Components |
1310 | 1999 | - | Mobile Communications Device Testing - Considerations when Selecting a System Power Supply |
1313 | 2000 | - | Agilent Technologies Wireless Test Solutions - Testing and Troubleshooting Digital RF Communications Transmitter Designs |
1316 | 1999 | 85XX | Optimizing Spectrum Analyzer Amplitude Accuracy |
1323 | 2000 | - | Internet Advisor - Testing and Troubleshooting Medium and High Speed Frame Relay Networks |
1333 | 1999 | - | Performing Bluetooth RF Measurements Today |
1333 | 2000 | - | Agilent - Performing Bluetooth RF Measurements Today |
1370-1 | 2000 | HP Vee | Data Logging Using Remote Programming |
1550-6 | 1992 | 8702-8703 | High-Speed Lightwave Component Analysis |
The original source of the Introduction and most of this information was the multi-page list at:
http://www.hpmemoryproject.org/ressources/resrc_an_01.htm (Not associated with the Hewlett-Packard Company)
That list has not been updated since 2014, when Curator Marc Mislanghe passed away.
Where PDF copies exist at HP Memory Project, they are linked via columns 1 & 4.
Here the list has been converted to a single-page, tidied-up html format by TerraHertz, and updated with further AN titles as they are found. URL: http://everist.org/spacejunk/want/HP_Application_Notes.htm
Other sources of scanned HP Application Notes:
I take the view that it is important to preserve the paper originals of technical documents such as the HP Application Note series. For multiple reasons, including trust of information veracity and typographic/image quality. Contemporary scanning utilities and file formats (eg PDF) are inadequate for preserving the spirit as well as the raw content of such works. Not to mention that most people undertaking scanning, have combinations of resources, skills and objectives that usually result in file visual quality ranging from mediocre to appalling. In general very disrespectful to the creators of the original document. Some even destroy the paper original during or after scanning. For convenience of scanning, or by reasoning "Now it's in digital form the paper original is a waste of space."
In contrast, I collect these works to preserve the genuine articles for posterity (and for my own reference.) I also experiment with practical methods of achieving higher quality/utility digital copies, with the aim of eventually publishing a combined 'how to' tutorial and tools. Plus scanning my collection of technical and cultural works, using those methods.
A few such experiments are linked in the table above; see #64-3, 73, 139.
Consequently I am more interested in obtaining paper originals than already scanned digital copies as PDF files.
Here's my list of HP App Notes I have so far.
If you have any physical paper HP Application Notes that I do not already have, that you would like to donate, please contact me: sjm at everist.org
In some cases I could buy small numbers of ANs offered for sale, but I am quite poor in this phase of my life.