Hewlett-Packard Application Notes

Revised 20191224

Introduction by John Minck

In a real sense, Hewlett-Packard sold MEASUREMENTS as well as products. According to one marketing professional, when you go to a hardware store to buy a 5mm drill bit, what you really want is a 5mm hole. So, likewise, as HP developed their massive line of innovative measurement instruments, the customers often had to be educated in the newer processes of the new measurement techniques, permitted by the newest product.

In-depth discussions of important techniques developed by HP engineers and written by them are published in the Hewlett-Packard Application Note Series. In the HP numbering and archiving strategy, Application Note titles were assigned to generic measurement tutorials, which might cover multiple instrument numbers.

Another category of technical notes were called Product Notes. Product Notes were instrument-specific and although a wide range of topics were permitted, in general, PNs expanded on instrument performance characteristics beyond the Technical Data Sheet of product descriptions and specs.

Application Notes (even old ones) are being posted by the Agilent Technologies Company. Starting from the Agilent's web site home page, select "Technical Support" and "Application Notes" then, filling the search box with the AN number you are looking for, you can get results that include vintage application notes.

The listing gives the following information:

Application Notes

AN-Nbr DATE Related Instr TITLE
3 1958 - Measurement of RF Pulse Carrier Frequency
4 ? AC-4A Model AC-4A Decade Counter
6 1960 - Homodyne Generator and Detection System
6-65 1965? 69XX DC Power Supplies - Harrison/HP
7 ? 430C Hewlett-Packard Model 430C Microwave Power Meter Accuracy
9 ? 490A Doppler Frequency Shift Simulation at Microwave Frequencies using Traveling Wave Tube Amplifier
10 ? - Microwave Spectrum Synthesis with the Traveling-Wave Tube
11 1955 - Domesticating the Traveling Wave Tube
12 1959 - How a Helix Backward-Wave Tube Works
14 1955 49X Traveling-Wave Tube Amplifiers
16 1964 - Waves on Transmission Lines
17 1966 - Square Wave & Pulse Testing of Linear Systems
18 1959 - Introduction to Solid State Devices
20 1961 612A Signal Generator Output Attenuators
20 1965 612A HP Signal Generator Output Attenuators
21 1961 - Microwave Standards Prospectus
24 ? - Pulse Modulation of Audio Oscillators
25 1961 120-130-1XX Cathode Ray Tube Phosphors and the Internal Graticule Cathode Ray Tube
29 ? - A Convenient Method for Measuring Phase Shift (With CRT Graticul Mask)
30 1964 608-803-417 Measurement of Cable Characteristics
31 ? 202A Externally Driving the 202A Low Frequency Function Generator
32 1963 50X-56X Guide for Selecting HP and DYMEC Digitizing Instruments for Specific Applications
36 ? - Sampling Oscillography
37 1959 120A-130A Monitoring a Radio Transmitter Signal with a 120A or 130A Oscilloscope
38 1962 - Microwave Measurements for Calibration Laboratories
41A 1960 405AR A Hold-Off Circuit for the Model 405AR Digital Voltmeter
41B 1960 405AR Increased Resolution for Permanent Records of DC Voltage with hp Model 405AR
41D 1960 405AR Decreasing the Response Time of the Model 405 Input Filter
43 1960 344A Continious Monitoring of Radar Noise Figure
44A 1960 185A Synchronizing the hp 185A Oscilloscope
44B 1960 185A More Information and Easier Pulse Analysis with the Model 185A Oscilloscope
44D ? 18X Characteristics and Use of hp Sampling Oscilloscope Probe and Accessories
45 1963 428A Direct Reading Test Meter Simplifies Magnetic Ink Printing Quality Control
46 1960 - Introduction to microwave measurements
47 1961 524C-D Providing 100-, 1,000-, and 10,000-Second Gate Times for the hp Model 524C/D Counter
48 1965 218A Applications of the hp Model 218A, a Versatile General-Purpose Pulse and Delay Generator
52 1965 5060A ++ Frequency and Time Standards
52-1 1974 - Fundamentals of Time and Frequency Standards
52-2 1975 - Timekeeping and Frequency Calibration
53 1962 185B Transmission Line Testing Using the Sampling Oscilloscope
55 1962 302A Converting the Model 302A Wave Analyzer for Use with Grounded-Input Recorders
56 1967 - Microwave Mismatch Error Analysis
57 1965 34X Noise Figure Primer
57-1 1983 8970A Fundamentals of RF and Microwave Noise Figure Measurements
57-1 2000 859X-NFA Agilent Fundamentals of RF and Microwave Noise Figure Measurements
57-2 1988 8970B Noise Figure Measurement Accuracy
57-2 2001 8590X-346X Noise Figure Measurement Accuracy - The Y-Factor Method
57-3 2000 - 10 Hints for Making Successful Noise Figure Measurements
58 1963 8714A The PIN Diode as a Microwave Modulator
58 1967 - The PIN Diode as a Microwave Modulator
59 1965 310-1110A Loop Gain Measurement with hp Wave Analyzers
60 1967 4XX-34XX Which AC Voltmeter ?
61 1964 690-691-130C Leveled Swept-Frequency Measurements with Oscilloscope Display
62 1964 1415A Time Domain Reflectometry
62 1988 54120T TDR Fundamentals - For Use with hp 54120T Digitizing Oscilloscope and TDR
62-1 1988 54120T Improving Time Domain Network Analysis Measurements
62-2 1990 54120 TDR Technics for Differential Systems
62-3 1990 541XX Advanced TDR Technics
63 1968 8551A Spectrum Analysis
63A 1967 8551A More on Spectrum Analysis
63B 1968 8441A The 8441A Preselector : Advancement in the Art of Spectrum Analysis
63C ? 8551A Measurement of White Noise Power Density
63D 1968 8551A-8406A Accurate Frequency Measurement: An Application of Spectrum Analysis
63E 1969 8551A Modern EMI Measurements
63E-1 1978 - Quasi-Peak Measurements Using a Spectrum Analyzer
63E-1 ? - Quasi-Peak Measurements Using a Spectrum Analyzer - Corrective of AN63E-1 Above
64 1965 43X Microwave Power Measurement
64 1968 43X Microwave Power Measurement
64-1 1977 43X Fundamentals of RF and Microwave Power Measurements
64-1A 1997 EPM-44X Fundamentals of RF and Microwave Power Measurements
64-2 1978 436A Extended Applications of Automatic Power Meters
64-3 1980 436A-346A Accurate and Automatic Noise Figure Measurements    Zip file
64-4A 1997 EPM-44X 4 Steps for Making Better Power Measurements
65 1965 690C-D Swept Frequency Techniques
66 1965 690 Swept SWR Tests in X-Band Coax
67 1968 1415A-1815B Cable Testing with Time Domain Reflectometry (With TDR Slide Rule)
68 1965 8614-8616B Accurate Receiver Sensitivity Measurements
69 1965 34XX ++ Which DC Voltmeter ?
70 1969 740-741B Precise DC Measurements
71 1966 606-608 Advances in RF Measurements Using Modern Signal Generators 50Kc-480Mc
72 1966 5201L-5551A Integral Counting
73 1966 5201L-5551A Calibration of a Gamma Ray Spectrometer     RARbook
75 1966 1415A Selected Articles on Time Domain Reflectometry Applications
76 1967 230A Using the 230A Power Amplifier
77-1 1967 8405A Transistor Parameter Measurements
77-2 1966 8405A Precision Frequency Comparison
77-3 1967 8405A Measurement of Complex Impedance 1-1000 MHz
77-4 1968 8405A Swept-Frequency Group Delay Measurements
78-1 1966 DYMEC-2801 Calibrating the Quartz Thermometer
78-2 1966 DYMEC-2801 Molecular Weight Determination with the Quartz Thermometer
78-3 1968 HP2801A Calorimetry and the Quartz Thermometer
78-4 1968 HP2801A A Glossary of Terms Pertaining to Temperature Measurements
78-5 1971 HP2801A Applications of the Quartz Crystal Thermometer
81 1967 203A Low Frequency Phase Shift Measurement Techniques
82 1966 - Power Supply/Amplifier Concepts and Modes of Operation
83 1966 - Increased Output Resistance for DC Regulated Power Supplies
84 1967 1416A Swept SWR Measurement in Coax
85 1966 5280A Using a Reversible Counter
86 1968 4800A-4815A Using the Vector Impedance Meters
87 1967 5210A FM and PM Measurements
88 1970 - Logic Symbology
89 1967 3960-3968 Magnetic Tape Recording Handbook
90 1967 HP-HARRISON DC Power Supply Handbook
90B 1978 HP-Only DC Power Supply Handbook
91 1968 8405A How Vector Measurements Expand Design Capabilities 1 to 1000 Mhz
92 ? 8410 Network Analysis at Microwave Frequencies
93 1969 540X Statistical Analysis of Waveforms and Digital Time-Waveform Measurements
93 ? 5400A Electronic Application of the 5400A (Technical Information Note 93)
94 1968 - Connector Design Employing TDR Techniques
95 1968 8410 ++ S-Parameters… Circuit Analysis and Design
95A 1973 - Selected Reprints on S-Parameters… Circuit Analysis and Design
95-1 ? - S-Parameter Techniques for Faster, More Accurate Network Design (Paper part of AN95)
96 1969 5105-5110B HP Direct-Type Frequency Synthesizers Theory, Performance and Use
98-1 ? 3722A Noise at Work - Model 3722A Aids Design of Process Control Systems
98-2 1969 H01-3722A Noise at Work - A Point by Point Correlator for the H01-3722A
99 1968 8541A 8541A Automatic Network Analyzer Measurement Capabilities
100 1968 - Acoustics Hanbook
101 1963 7560-7561A Multiplication and Division by Logarithms (HP-Moseley Division)
102 1963 7000-7100 Program Controllers (HP-Moseley Division)
105 1961 MOSELEY Polarography
105 1967 - Polarography (HP-Moseley Division)
106 1967 135-Moseley Electric Motor Testing Performance (HP-Moseley Division)
107 1965 - Guard Circuits (HP-Moseley Division)
108 1966 101-Moseley Hysteresis Curve Plotting (HP-Moseley Division)
109 1969 62XX Power Supply Overvoltage "CROWBARS"
110 1968 8410 Anrenna/Radome Boresight Error Measurements
112-1 1968 675-676A Low-Frequency Network Analysis with the 675A/676A
112-2 1969 675-676A Using the 675A/676A Network Analyzer as an Educational Tool
114 1969 653A A2A Video Transmission System Alignment
115 1970 - Principles of Cathode-Ray Tubes, Phosphors, and High-Speed Oscillography
116 1969 5360A Precision Frequency Measurements
117-1 1970 8410 Microwave Network Analyzer Applications
117-2 1971 8410-11608A Stripline Component Measurements with the 8410A Network Analyzer
118 1970 1815A Dielectric Measurements with Time Domain Reflectometry
120 1969 5360A A New Technique for Pulsed RF Measurements
120-2 1970 5360A Measuring Phase with the 5360A Computing Counter
120-3 1970 5360A Non-Linear Systems Applications of the Computing Counter System
121-1 1970 8407A Network Analysis with the HP 8407A 0,1 - 110 MHz
121-2 1970 8407A Swept Impedance with the HP 8407A 0,1 - 110 MHz
122 1968 8551A EMI Measurement Procedure (according to MIL-STD 826A)
123 1970 - Floating Measurements and Guarding
124 1970 - True RMS Measurements
125 1970 3480B-2912A Data Acquisition - 3480B Digital Voltmeter - 2912A Scanner - 2547A Coupler
126 1970 3590A Theory and Applications of Wave Analyzers
127 1970 5480B Signal Averaging Enhancement of RF and Pulse Measurements
128 1970 6177B-618XB Applications of a DC Constant Current Source
129 ? - Logic Timing Measurements
130 1970 2570A Instrumentation Control with the HP Coupler/Controller
131 1971 2570-2575A Time-Sharing Based Instrumentation Terminal
132 1971 2570A-9100 Calculator Based Instrumentation Systems
133-1 1971 3480-180A Low Frequency Pulse Amplitude Measurements
133-2 1971 3485A A Guide to Remote Control of the 3485A Scanning Unit
133-3 1971 3480-2070A A Guide to Using Data Storage
133-4 1972 3480-2070A A Guide to Using Sample-and-Hold
134 1971 8556A-8552B Audio Frequency Measurements with the 8556A-8552B Spectrum Analyzer
135-1 1971 2116 ++ Computerized Data Acquisition Aids Final Testing
135-2 1971 2116 ++ High-Volume Production Testing
135-3 1971 2116 ++ Process Monitoring in Manufacturing
135-4 1971 2116 ++ Closed-Loop Production Testing
135-5 1971 2116 ++ A Mobile Process Control Laboratory
135-6 1971 2116 ++ Computer Analysis Aids Battery Testing
135-7 1971 2114-2116 ++ Data Acquisition and Analysis at Sea
135-8 1971 2116 ++ Minicomputer System Aids Busy Psychology Lab
135-9 1971 2116 ++ In-Flight Data Analysis Improves Airborne Research
135-10 1971 2114 ++ Computer Speeds Gas Turbine Combustor Testing
135-11 1971 2116 ++ Stable Measurements on the High Seas
135-12 1971 2116 ++ Depot Testing of Avionic Modules
135-13 1973 2116 ++ Domestic Communications Satellites - A World's First
135-14 1972 2115 ++ Computerized Process Control Improves Sugar Refinery Production
135-15 1972 2116 ++ Minicomputer System Benefits Fuel Cell Technology
135-16 1972 2116 ++ Minicomputer Systems Aid Military Vehicle Testing
135-17 1972 2116 ++ Testing Ovonic Read-Mostly Memories
135-18 ? 2100A ++ An Automated Engine Laboratory in a Research Environment
135-19 1972 2116 ++ Testing Thick-Film Hybrid Circuits
135-21 1973 9500 ++ Viggen Avionics Support
135-22 1973 2100 ++ Real-Time Multiprogramming System Boosts Productivity for NCR
135-23 1973 9500 ++ Television Set Production Revolutionized by Automatic Alignment and Test
135-24 1973 2100A ++ Automated System Improves Spacecraft Testing
135-25 1973 2116 ++ Automation in Production Testing
136 1973 8445B-8555A Understanding and Operating the 8555A Spectrum Analyzer and 8445B Preselector
137 1971 4470A Probing Transistor Noise
138 1971 5401B Multichannel Analyzer Applications
139 1971 5586A Stabilizing Gamma-Ray Spectrometer Systems with the HP 5586A Spectrum Stabilizer     RARbook
140-0 ? 5450 Fourier Analayser Training Manual
140-1 1971 5450 Detecting Sources of Vibration and Noise Using HP Fourier Analyzers
140-2 1971 5450 Feedback Loop and Servomechanism Measurements Using HP Fourier Analyzers
140-3 1972 5451 Dynamic Testing of Mechanical Systems Using Impulse Testing Techniques
140-4 ? 5451 Digital Auto-Power Spectrum Measurements
140-5 1973 5451 Measurement of Transfer Functions with Wide Dynamic Range
140-6 1973 5451 Measurement of Machine Tool Vibration
140-7 1974 5451 Nuclear Power Plant Diagnostics Using Fourier Analysis Techniques
141 1971 5257A AM, FM Measurements with the Transfer Oscillator
142-XX 1968 8551 EMI Measurement Procedure (With 8551 Calibration Slide Rule)
142 1972 855X EMI Measurement Procedure
144 ? - Understanding Microwave Frequency Measurements
145-1 1971 2000C First Small Computer Solution to Text Editing Systems
145-2 1971 2114 Minicomputer Untangles Massive Inventory Problem in Heavy Industry
145-3 1971 2116B Flexible Computer-Controlled Laser System Revolutionizes Garment Industry
145-4 1971 2000C Inexpensive Time-Share System Solves Unique College Registration Problems
145-5 1971 2000C Computer System Helps Graduate Business School Teach Management Technology
145-6 1972 2000C Dedicated Time-Sharing Fills Multitude of Management Needs
145-7 1972 2000B Computer System Helps Motivate High School Students
145-8 1972 - Minicomputer Systems Improve Auto Maker's Production Efficiency
145-9 1972 2120A Low-Cost Batch System Streamlines Construction Projects
145-9 1973 2100 Microprogrammable Mini Expand University Computer Science Program
145-10 1972 2100A Rugged Minicomputer System Helps Ships Find the Sure, Safe Way
145-11 1972 2000X Time-Shared Systems Expand Scope of Education
145-12 1972 2000 Inexpensive Computer System "Does it All" for Small Manufacturer
145-13 1972 2000 Computer Systems Raise Student Achievement Levels
145-14 1972 2100 Small Computer System Pinpoints Suspects for Police Departments
145-15 1973 2000 Computer Systems Help University Provide Quality, Personalized Instruction
145-16 1973 2100 Small Computer System Keeps Apparel Industry in Style
145-17 1973 2000 Versatile Computer Systems Streamlining Hawaiian Industry
145-18 1973 2100 Small Computer System Keeps Meteorologists on Top of the Weather
145-19 1973 200X Small System Provides Bank with Versatile New Problem-Solver
145-20 1973 2100 Efficient Computer Systems Help Firm Maintain Competitive Edge
145-25 1974 200X Computer Network Connects Field Offices and Manufacturing Divisions
150 1974 855X Spectrum Analysis…. Spectrum Analyzer Basics
150 1989 70XXX Spectrum Analysis…. Spectrum Analyzer Basics
150A 1973 8558B Spectrum Analysis…. Using the 8558B Spectrum Analyzer
150B 1978 8557A-8558B Spectrum Analysis…. Using the 8557A and 8558B Spectrum Analyzers
150-1 1971 855X Spectrum Analysis Amplitude and Frequency Modulation
150-1 1989 - Spectrum Analysis Amplitude and Frequency Modulation
150-2 1971 855X Spectrum Analysis…. Pulsed RF (With Pulsed RF Calculator Slide Rule)
150-3 1974 855X-8444A Spectrum Analysis…. Swept Frequency Measurements and Selective Frequency Counting with a Tracking Generator
150-4 1974 855X Spectrum Analysis…. Noise Measurements
150-5 1973 855X Spectrum Analysis…. CRT Photography and X-Y Recording Techniques
150-6 1974 855X Spectrum Analysis…. CATV Proof of Performance
150-7 1975 855X Spectrum Analysis…. Signal Enhancement
150-8 1976 855X Spectrum Analysis…. Accuracy Improvement
150-9 1976 855X Spectrum Analysis…. Noise Figure Measurement
150-10 1976 855X Spectrum Analysis…. Field Strength Measurement
150-11 1976 855X Spectrum Analysis…. Distorsion Measurement
150-12 1977 8565A-11517A Spectrum Analysis…. Using the HP 11517A External Mixer to 40 GHz
150-13 1978 8565A-8709A Stimulus-Response Measurements… Using the HP 8565A Spectrum Analyzer from 2-18 GHz
150-14 1978 855X Spectrum Analysis…. Using External Waveguide Mixers Above 40 GHz
150-15 2004 VSA Vector Signal Analysis Basics
151 1973 - Fundamentals of Air Navigational Systems
152 1972 - Probing in Perspective
153 1972 1415A-1815A Permeability, Permittivity and Conductivity Measurements with Time Domain Reflectometry
153-1 1997 815X The Basics of Fiber Optic Measurement and Calibration
154 1972 8410 ++ S-Parameter Design
154 1990 8510-875X S-Parameter Design
155-1 1976 8755 ++ Active Device Measurements with the HP 8755 Frequency Response Test Set
155-2 1977 8755 ++ 100 dB Dynamic Range Measurements Using the HP 8755 Frequency Response Test Set
155-3 1981 8755S Automating the HP 8755 Scalar Network Analyzer
156-1 ? 5526A Laser Measurement System - Remote Laser Interferometry
156-2 ? 5526A Laser Measurement System - Calibration of a Surface Plate
156-3 1972 5510A Laser Measurement System - Principles of Automatic Compensation
156-4 ? 5526A Laser Measurement System - Calibration of a Machine Tool
156-4 ? 5526A Système de Mesure à Laser - Etalonnage d'une Machine Outil (French Translation of AN 156-4)
156-5 1976 5526A Laser Measurement System - Measurement of Straightness of Travel
156-5 1979 5526A Système de Mesure à Laser - Mesure de la Rectitude d'un Déplacement (French Translation of AN 156-5)
157 1972 3570-3575 ++ Low Frequency Gain Phase Measurements
158 1973 34XX ++ Selecting the Right DVM
161-1 ? 9800-9830 Structural Engineering Applications - HP Series 9800 - The Name and Number That Save Time and Money
161-2 ? 9800-9830 Electrical Engineering - Transformer Engineers Save Time, Improve Accuracy with Calculator-Aided Design
162-1 ? 5326-5327 Time Interval Averaging
163-1 1973 105XX Techniques of Digital Troubleshooting
163-2 ? 161X-500X The IC Troubleshooters - New Techniques of Digital Troubleshooting
164-1 1974 8660A-B Programming the 8660A/B Synthesized Signal Generator (Standard BCD Interface)
164-2 1974 8660A-B Calculator Control of the 8660A/B/C Synthesized Signal Generator (Optional HP-IB Interface)
164-3 1975 8660 New Techniques for Analyzing Phase Locked Loops
164-4 1975 8660 Digital Phase Modulation (PSK) and Wideband FM… Using the 8660A/C Synthesized Signal Generator
166 ? 131X-1321A Large Screen Display Applications and Interfacing
166-2 ? 1304A Large Screen Display Applications and Interfacing (Supplement to AN 166)
167-1 ? 5000A The Logic Analyzer
167-2 ? 1601 Digital Triggering for Analog Measurements
167-3 ? 1601 Functional Digital Analysis
167-4 1975 1600A-1607A Engineering in the Data Domain Calls for a New Kind of Digital Instruments (Reprint from Electronics Magazine May 1/75)
167-5 1975 1600A-1607A Troubleshooting in the Data Domain is Simplified by Logic Analyzers (Reprint from Electronics Magazine May 15/75)
167-5 1975 1600A-1607A Le dépannage des Systèmes Travaillant dans le Domain des Etats est Simplifié par l'Emploi des Analyseurs Logiques
167-6 ? 1600A Mapping a Dynamic Display of Digital System Operation
167-7 ? 1600A Supplementary Data from Map Displays Without Changing Probes
167-8 ? 1620A-7900A Stable Displays of Disc System Waveforms Synchronized to Record Address
167-9 ? 1600A-1607A Functional Analysis of the Motorola M6800 Microprocessor System
167-9 1976 1600A-1607A Analyse Fonctionnelle du Microprocesseur Motorola M6800 (French Translation of AN 167-9)
167-10 ? 1620A Using the 1620A for Serial Pattern Recognition
167-11 ? 1600A-1607A Functional Analysis of Intel 8008 Microprocessor Systems
167-11 1976 1600A-1607A Analyse Fonctionnelle du Microprocesseur 8008 Intel (French Translation of AN 167-11)
167-12 ? 1600A-1607A Functional Analysis of Fairchild F8 Microprocessor Systems
167-12A ? 1600A-1607A Functional Analysis of Mostek F8 Microprocessor Systems
167-13 ? 1740S The Role of Logic State Analyzers in Microprocessor Based Designs
167-14 ? 1600A-1607A Functional Analysis of 8080 Microprocessor Systems
167-14 1976 1600A-1607A Analyse Fonctionnelle du Microprocesseur 8080 (French Translation of AN 167-14)
167-15 ? 1600A-1607A Functional Analysis of Intel 4004 Microprocessor Systems
167-16 ? 1600A-1607A Functional Analysis of Intel 4040 Microprocessor Systems
167-17 ? 1600A-1607A Functional Analysis of National IMP Microprocessor Systems
167-18 ? 1600A-1607A Functional Analysis of National Semiconductor SC/MP Microprocessor System
167-19 ? 1600A-1607A Systematic "turn-on" of Microprocessor Systems Using Logic State Analyzers
170-1 ? 8640A-B HP 8640A/B Signal Generator Output Level Accuracy
170-2 1975 8640A-B HP 8640A/B Signal Generator Third-Order Intermodulation Characteristics
171-1 1974 8640-8405A Crystal Testing with the HP 8640A/B and HP 8405A
171-2 1974 8640B Extending the 8640B Frequency Down to DC
172 1970? - The Fundamentals of Electronic Frequency Counters
173 1974 5340 ++ Recent Advances in Pulsed RF and Microwave Frequency Measurements
173-1 1975 5345A Dynamic Measurement of Microwave Voltage Controlled Oscillators with the 5345A Electronic Counter
174-0 ? 5345A Index to the AN 174 Application Notes Series
174-1 ? 5345A Measuring the Transfer Characteristic of a Voltage Controlled Oscillator
174-2 ? 5345A Measuring Differential Nonlinearity of a Voltage Controlled Oscillator
174-3 ? 5345A Measuring Integral Nonlinearity of a Voltage Controlled Oscillator
174-4 ? 5345A Measuring Dual VCO Tracking Error
174-5 ? 5345A Determining Probability Densities (Histograms) with the 5345 Electronic Counter
174-6 ? 5345A Measuring the Stability of a Frequency Source
174-7 ? 5345A Measuring Fractional Frequency Deviation (Short Term Stability of Oscillators)
174-8 ? 5345A Measuring FM Peak-to-Peak Deviation
174-9 1974 5345A Making Automatic Phase Measurements with the 5345A Electronic Counter
174-10 1974 5345A Measuring Electrical Length (Delay) of Cables
174-11 1974 5345A-59308A Measuring Warm-Up Characteristics and Aging Rates of Crystal Oscillators
174-12 1974 5345A-59308A Measuring Frequency Sweep Linearity of Sweep Generators
174-13 1974 5345A-59308A Measuring the Tuning Step Transient Response of VCO's to 18 GHz
174-14 1987 5345A Radar System Characterization and Testing Using the HP 5345A Electronic Counter
175-1 1974 MLA Microwave Link Measurement - Differential Phase & Gain at Work
176-8 to 16 ? - Gas Chromatography / Mass Spectometry Application Notes Series
181-1 1974 5340A Measuring Linearity of VCO's from 10 Hz to 23 GHz
181-2 1974 5300B Data Acquisition with the 5300B Measuring System
181-2 1986 535X Voltage-Contolled Oscillators Characterization
183 1978 8755 ++ High Frequency Swept Measurements
185 1974 1722A Waveform Parameter Measurements Using the Microprocessor Controlled Oscilloscope Model 1722A
185-2 ? 1722A Transmission Line Matching and Length Measurements Using the Microprocessor Controlled Oscilloscope Model 1722A
185-3 ? 1722A Percent Amplitude Modulation Measurement in the Time Domain
185-4 ? 1722A Elimination of Computation on Analog Measurements by Using the Direct Reading Oscilloscope Model 1722A
186 ? 1722A Dual-Delayed Sweep for Precise Time Interval Measurements
187-2 1975 8620-8709 ++ Configuration of a 2-18 GHz Synthesized Frequency Source Using the 8620C Sweep Oscillator
187-3 1976 8755-8410 ++ Three HP-IB Configurations for Making Microwave Scalar Measurements
187-4 1976 8620-8709 Configuration for a Two-Tone Sweeping Generator
187-5 1976 8620-5340 Calculator Control of the 8620C Sweep Oscillator Using the Hewlett-Packard Interface Bus
187-6 1979 8620-8709 ++ The Frequency Performance of the 8620C Sweep Oscillator Under Remote Programming
188 ? 3050B Thermocouple Measurements with the 3050B
190 1975 8620-8709 ++ 40 GHz Frequency Measurement with Standard HP Instruments
191 1976 534X-5363A Precision Time Interval Measurements Using an Electronic Counter
191-1 1977 5359A-5363A Automatic Zero Calibration of the 5359A Time Synthesizer at a Designated Remote Location
191-2 1977 5359A Determining Digital Circuit Timing Tolerance to Optimize Adjustment or Design
191-3 1977 5370A Precision Time Interval Measurements in Radar Applications
191-4 1978 5370A Using the 5370A Universal Time Interval Counter to Characterize Pulse Width, Repetition Rate and Jitter
191-5 1980 5370A-5363B Measurement of Propagation Delays Using the 5370A Time Interval Counter and 5363B Time Interval Probes
191-6 1980 5370A-5363B Precise Cable Length and Matching Measurements Using the 5370A Time Interval Counter and 5363B Time Interval Probes
191-7 1987 5370B HP 5370B Universal Time Interval Counter - High-Speed Timing Acquisition and Statistical Jitter Analysis
192 1975 358X-855X Using a Narrow Band Analyzer for Characterizing Audio Products
195 1975 8011-8015 Pulse Generator Techniques in CMOS Applications
196 1975 436A Automated Measurements Using the 436A Power Meter
196-1 1979 432C Automated Power Measurements Using the 432C Power Meter - Including Waveguide and Fiber Optic Measurements
197-1 1975 5501A Laser Interferometers for Position Feedback
197-2 ? 5501A Laser and Optics
198 1975 1230A Event-Related Triggering a Clear Solution for Digital Signals
199 ? 133X Small Screen Displays Medical Diagnostic System Applications and Interfacing
200 1978 53XX Fundamentals of the Electronic Counters
200 1997 53XX Fundamentals of the Electronic Counters
200-1 1977 53XX Fundamentals of Microwave Electronic Counters
200-1 1997 53XX Fundamentals of Microwave Electronic Counters
200-2 ? - Fundamentals of Quartz Oscillators
200-3 ? 53XX Fundamentals of Time Interval Measurements
200-4 1997 53XX Understanding Frequency Counter Specifications
201-1 1976 2108A ++ Automatic Q-A Evaluation of Precision Resistors
201-2 1976 2108A ++ Measuring Differential Non-Linearity of a Voltage-Controlled Oscillator
201-3 1976 2113A ++ A Multiple Station Electronic Test System
201-4 1977 HP1000 ++ Performance Evaluation of HP-IB Using RTE Operating Systems
201-5 1977 HP1000 ++ The HP-IB Link: Control of Distributed HP-IB Devices
201-6 1980 HP1000-9825 Computer Communications: HP 9825 - HP 1000
201-7 1978 HP1000-3455 High-Performance Software for the HP 3455A/3495A Subsystem
201-8 1979 HP1000 ++ The Use of Device Subroutines with the HP 1000 Computers
202-01 1976 2100S-7260A Optical Mark Reader Substantially Incease Productivity
202-03 1976 7261A Distributed Hewlett-Packard Optical Mark Readers Provide Easy Remote Data Collection
204-1 1977 3050B Automatic Accelerometer Calibration Helps Assure Air Dropped Cargo Survivability
204-2 1977 3050 Energy Conservation in a Restaurant - Measurement / Computation Using Hewlett-Packard's Data Aquisition System
205-1 1977 3042A Low Frequency Amplitude Considerations of 3042A System
205-2 1979 3042A Sonar Transducer Calibration - Measurement and Computation with Hewlett-Packard's 3042A Automatic Network Analyzer System
206-1 1977 3045A Measuring Wideband Noise with the HP 3045A Automatic Spectrum Analyzer
207 1976 3045A Understanding and Measuring Phase Noise in the Frequency Domain
210-1 ? DTS-70 Digital Test System - Modeling and Simulation for Digital Testing
210-4 ? DTS-70 Digital Test System - Designing Digital Circuits for Testability
212-1 1977 HP1000 Building an Inventory Control Data Base
212-2 1977 HP1000 Building an Order Processing Data Base
214-1 1977 704X Recording with Input Noise Present
214-2 1977 704X X-Y Recorder Dynamic Response
214-3 1977 704X X-Y Recorder Input Connection Configuration and Input Noise
214-4 1977 704X High-Sensitivity X-Y Recorder Has Few Input Restrictions
216 ? 3570A-3571A A Guide to the Use of HP3570A and 3571A Analyzers
218-1 1977 8671A-8672A Applications & Performance of the 8671A and 8672A Microwave Synthesizers
218-2 1977 8671A-8672A Obtaining Millihertz Resolution from the 8671A & 8672A
218-3 1978 8660-8672A A 1 MHz to 18 GHz Signal Generator with 1, 2, or 3 Hz Resolution
218-4 1979 8672-938-940A Synthesized Signals from 18 to 37,2 GHz Using the 8672A
218-5 1981 8672A-11720A Obtaining Leveled Pulse-Modulated Microwave Signals from the HP 8672A
219 1977 8505A HP 8505A RF Network Analyzer Basic Measurements
220 1977 8565A Operating the HP 8565A Spectrum Analyzer
221 1977 8410B-9825A Semi-Automatic Measurements Using the 8410B Microwave Network Analyzer and the 9825A Desk-Top Computer
221A 1980 8410B Automating the HP 8410B Microwave Network Analyzer
222 1977 5004A A Designer's Guide to Signature Analysis
222 1977 5004A Guide d'Utilisation de l'Analyse de Signature (French Translation of AN 222)
222-1 ? 3060A Implementing Signature Analysis for Production Testing with the HP 3060A Board Test System
222-2 1979 5004A Application Articles on Signature Analysis
222-3 1980 5004X A Manager's Guide to Signature Analysis
222-4 1977 2240A An Intelligent Analog/Digital Subsystem to Simplify Product Test and Equipment Control - Signal Conditioning: HP 22914A Card
222-5 1982 500X-HP85 Increasing Productivity in Manufacturing and Service with a Logic Troubleshooting System
222-6 1983 5006A Troublshooting with Composite Signatures
222-11 1981 500X A Signature Analysis Case Study of a 6800-Based Display Terminal
222-12 1982
A Signature Analysis Based Test System for ECL Logic
223 ? 1600A-1741A Oscilloscope Measurements in Digital Systems
224-1 1977 2240A An Intelligent Analog/Digital Subsystem to Simplify Product Test and Equipment Control - Measurement and Control Examples
225 1978 5390A Measuring Phase Spectral Density of Synthesized Signal Sources Exhibiting F0 and F-1 Noise with the 5390A Freq. Stability Analyzer
225-1 ? 5390A Measurement Considerations when Using the 5390A Option 010
226 1977 9850A-9825A Automatic Transceiver Testing with the 8950A
227 1977 8016A Word Generator Techniques in Multi-Channel Applications
229-1 1977 7221A HP-Plot/21 Software Conversion Guide
231-1 1979 3779 Single Channel Codec Testing
231-2 1983 3779 Codec Testing with the HP 3779C/D Primary Multiplex Analyzer
231-3 1984 3779 Making Telecommunications Measurements in Complex Impedances
233-1 1981 1610A Funtional Analysis of Signetics 2650 Microprocessor Systems Using the 1610A
233-2 ? 1610A Funtional Analysis of TMS 9900 Microprocessor Systems Using the 1610A
233-3 ? 1610A Funtional Analysis of Z80 Microprocessor Systems Using the 1610A
233-4 ? 1610A Funtional Analysis of 8080 Microprocessor Systems Using the 1610A
233-5 ? 1610A Funtional Analysis of 6800 Microprocessor Systems Using the 1610A
233-6 1980 1610A-B Functional Analysis of HP-1000 L-SeriesComputer Using the 1610A/B
233-7 1980 1610A-B Computer Performance Analysis Using the 1610A/B
234-1 1977 8568A 8568A Spectrum Analyzer Operation
235 ? 654A-3320C An Introduction to Balanced Circuits and Impedance Matching
236-1 1977 - A "MAKE" or "BUY" Analysis for Power Supplies
236-2 1979 - Two Power Supply Redundancy Schemes
236-4 1981 65000 EMI/RFI and HP 65000A Series Power Supplies - Meeting FCC and VDE Requirements for Computing Equipment
238 1980 4140B Semiconductor Measurements with the HP 4140B Picoammeter / DC Voltage Source
238-1 1981 4140B-HP85 Ultra Low Current Semiconductor DC Parameter Measurement System using HP 4140B
240-0 1977 5420A Analyse Numérique de Signaux (French Translation of AN 240-0)
240-1 ? 5420A Digital Signal Analysis - Feedback Control System Measurements
240-1 1979 5420A Analyse Numérique de Signaux - Mesure sur les Systèmes Asservies (French Translation of AN 240-1)
240-2 ? 5420A Improving the Accuracy of Structural Response Measurements
240-2 ? 5420A Amélioration de la Précision des Mesures de Réponse de Structures Mécaniques (French Translation of AN 240-2)
243 1994 3582A The Fundamentals of Signal Analysis
243-1 1983 358X Effective Machinery Maintenance Using Vibration Analysis
243-1 1994 3562 Effective Machinery Measurements Using Dynamic Signal Analyzers
243-1 1983 358X Maintenance de Machines par l'Analyse de Vibration (French Translation of AN 243-1)
243-2 1991 3562 Control System Development Using Dynamic Signal Analyzers
243-2 1987 3562 Measuring Switching Power Supply Stability with the HP 3562A (Supplement of AN 243-2)
243-3 1992 3562 The Fundamentals of Modal Testing
243-4 1991 3562 Fundamentals of the Z-Domain and Mixed Analog/Digital Measurements
243-5 1992 - Control System Loop Gain Measurements
243-6 1992 3562-3577 Control System Measurement Fundamentals Using Dynamic Signal Analyzers and Accessories
243-7 1995 358X Bearing Runout Measurements
245-1 ? 3582A Signal Averaging with the 3582A Spectrum Analyzer
245-2 ? 3582A Measuring the Coherence Function with the 3582A Spectrum Analyzer
245-3 ? 3582A Third Octave Analysis with the 3582A Spectrum Analyzer
245-4 1979 3582A Accessing the 3582A Memory with HP-IB
245-5 1979 3582A Log Sweep with the 3582A Spectrum Analyzer
246 1978 3585A Using the HP 3585A Spectrum Analyzer with the HP 9825A Computing Controller
246-1 1979 3585A Optimizing the Dynamic Range of the HP 3585A Spectrum Analyzer
246-2 1981 3585A Measuring Phase Noise with the HP 3585A Spectrum Analyzer
250-1 1978 - HP-IB / Power Supply Interface Guide
250-2 1979 - Battery Charging / Discharging (Lab & Industrial Power Sources)
260-1 ? 1615A Understanding Hewlett-Packard's Model 1615A Logic Analyzer
262 1978 1725A Eliminating Time-Base Errors from Oscilloscope Measurements
263 ? 10023A Thermal Measurements of Electronic Components Using the Hewlett-Packard Temperature Probe
270-1 1978 8568A An Example of Automatic Measurement of Conducted EMI with the HP 8568A Spectrum Analyzer
270-2 1980 8568A Automated Noise Sideband Measurements Using the HP 8568A Spectrum Analyzer
271-1 1978 1350A-9825A Adding Soft Copy Graphics to 9825A Based HP-IB Systems Using the Model 1350A Graphic Translator
272 1978 1743A Precise Time Interval Measurements Using the Crystal Controlled Time Base Model 1743A Oscilloscope
275 1979 1640A Symptomatic Troubleshooting of Computer Networks with the HP 1640A
275-1 1979 1640A Using the HP 1640A Serial Data Analyzer with the Epitape Recorder
275-2 1979 1640A Using the HP 1640A Serial Data Analyzer with the Spectron T-511 Tape Unit
276 1980 133X Continuous Tone Imaging with Cathode-Ray Tube Displays
280-1 ? 1602A Making Complex Measurements with the HP Model 1602A Logic State Analyzer
280-2 1978 1602A Monitoring the IEEE-488 Bus with the 1602A Logic State Analyzer
280-3 1978 1602A The 1602A Logic State Analyzer As An Automatic Test Instrument
280-4 1979 1602A Using 1602A's for Measurements on Wide Buses in Manual and Automatic Modes
281-1 1978 HP1000 Microprogramming - A Way to Get Higher Performance from HP 1000 Computers
281-2 1978 HP1000 HP 1000 M-Series to E-Series Microprogram Conversion
281-3 1978 HP1000 Using the HP 1000 E-Series Microprogrammable Processor Port
282-1 1978 6940B 6940B Multiprogrammer System Throughput Analysis for Multiprogrammer Systems Using the 9825A Desktop Computer
283-1 1981 8662A Applications and Measurements of Low Phase Noise Signals Using the 8662A Synthesized Signal Generator
283-2 1979 11721A External Frequency Doubling of the 8662A Synthesized Signal Generator
283-3 ? 8662A-8663A Low Phase Noise Applications of the HP 8662A and 8663A Synthesized Signal Generators
285 1979 4904A-4930A Successful Buried Cable Fault Locating
286-1 1980 8901A Applications and Operation of the 8901A Modulation Analyzer
286-2 1981 8901A Accurate Mixer/Amplifier Compression Measurement Using the 8901A Modulation Analyzer
287-1 ? 5328A Waveform Analysis Using the 5328A Universal Frequency Counter
287-2 ? 5345A-5359A Frequency Profile Using an HP 5345A Electronic Frequency Counter and an HP 5359A Time Synthesizer
287-3 ? 5370A-5359A Frequency Profile Using an HP 5370A Universal Time Interval Counter and an HP 5359A Time Synthesizer
289 1979 8165A A Stimulus for Automatic Test
290 1980 - Practical Temperature Measurements
290 1997 - Practical Temperature Measurements
290-1 1987 - Practical Strain Gage Measurements
290-2 1982 3497A Using the HP 3497A to Control Industrial Wastewater Treatment
290-2 1983 3497A Utilisation du HP 3497A pour le contrôle-Commande du Traitement des Eaux Résiduaires Industrielles (French Translation of AN 290-2)
291-1 1979 5345A-5355A Application Guide to the 5355/56 Automatic Frequency Converter
292 1979 1610A-HP1000 Minicomputer Analysis Techniques Using Logic Analyzers
292-1 1981 1610A-1615A Funtional Analysis of the IEEE-488 Interface Bus
293 ? 1611A Funtional Analysis of Microprocessor Systems with the 1611A Option 001 General Purpose Module
294 1979 8754A-9825A Semi-Automatic R.F. Network Measurements Using the HP 8754A Network Analyzer and the HP 9825A Desktop Computer
296 1980 8170A An Apllications Guide for the 8170A Logic Pattern Generator
296-1 1980 8170A 8170A Logic Pattern Generator Simulates Multi-Channel Serial Data
297-1 1981 8161A 8161A Programmable Pulse Generator
297-2 1981 8161A-5370A 8161A Automated Reverse Recovery Time Measurements of Diodes
298-1 1980 64000 RS-232-C Communications with HP 64000 Logic Development System
298-2 1981 64000 Software Project Management with HP 64000 Logic Development System
298-3 1981 64000 Enhancing 64000 System Assemblers with Model 64851A User Definable Assembler
298-4 1981 64000 HP 64000 Logic Development System Microassemblers for Bit-slice Processors
298-5 1980 64000 Using HP 64000 with Logic Development System Computer Networks
299 1980 1336A Interfacing HP's Model 1336A Display to High-Resolution Imaging Systems
300 1980 89XX-HP85 High Performance Semi-Automatic Transceiver Testing
301-1 1980 10544-10811 Low Noise Division of 10 MHz Oscillators
302-1 1980 4191A Direct Radio Frequency Impedance Measurements Using the 4191A RF Impedance Analyzer
302-2 1981 4191A Impedance Characterization of High Q Devices from 1MHz to 1000MHz with 1Hz Resolution Using the 4191A RF Impedance Analyzer
308-1 1980 3060A Dynamic Digital Board Testing with the HP Model 3060A Option 100
309-1 1981 3060A Static Digital Testing Using the HP 3060A Board Test System
309-2 1981 3060A Networking your Computer to the HP 3060A Board Test System
311 1981 - Economics of IC Testing at Incoming Inspection
312-1 1981 8350-8709 Configuration of a Two-Tone Sweeping Generator 8350A/8620C Sweep Oscillators
313-1 ? 5180A Troubleshooting Microprocessor-Based Systems Using the 5180A Waveform Recorder and a Logic Analyzer
313-2 ? 5180A-85XX Teaming Up a 5180A Waveform Recorder and a Spectrum Analyzer for New Time-Domain Measurement Capabilities
313-3 ? 5180A Using the 5180A Waveform Recorder to Measure Microwave VCO Settling Time and Post Tuning Drift
313-4 ? 5180A-5359A Extending Frequency Range and Increasing Effective Sample Rate on the 5180A Waveform Recorder
313-5 ? 5180A Power Supply Testing with the 5180A Waveform Recorder
313-6 ? 5180A-5359A Recording Sonar and Other Signals Using the 5180A's Toggle Mode
313-7 ? 5180A-3325A Interconnecting Two or More 5180A Waveform Recorders to Obtain Multiple Input Channels
313-8 ? 5180A-9826 Using the Direct Memory Access Capability of the 5180A Waveform Recorder with the 9826 Desktop Computer
313-9 ? 5180A-8112A Using the 5180A Waveform Recorder to Evaluate Floppy Disc Media and Drive Electronics
313-10 1988 5185A-5185T HP 5181A Waveform Recorder - HP 5185T Digitizing Oscilloscope - Radar System Characterization and Testing
313-11 1988 5185T Using Digital Filtering Techniques to Improve Analog-to-Digital Converter Measurements
314 1981 1741A Variable-Persistence Aids Signal Display (Reprint from EDN Magazine)
314-1 1986 8770S Receiver Testing with the 8770S Arbitrary Waveform Synthesizer System
314-2 1986 8770S Synthesizing Magnetic Disc Read and Servo Signals with the HP 8770S Arbitrary Waveform Synthesizer System
314-3 1986 8770S Television Signal Simulation with the HP 8770S Arbitrary Waveform Synthesizer System
314-4 1987 8770A-8780A Exceptionally-Complex Signal Simulation for Multi-Signal Environments in Radar/EW Test
314-5 ? 8780A-8791 A Guide to Microwave Upconversion
315 1985 4145A DC Parametric Analysis of Semiconductor Devices
315 1992 4145B Practical Applications of the HP 4145B Semiconductor Parameter Analyzer - DC Parametric Analysis of Semiconductor Devices
316-3 1982 6942A High Speed FET Scanning with the 6942A Multiprogrammer
317 1982 4193A-9845B Practical Design and Evaluation of High Frequency Circuits Using the HP 4193A Vector Impedance Meter
319 1982 818X Parametric Characterization of Digital Circuits Up to 50 MHz
322 1983 4280A Analysis of Semiconductor Capacitance Characteristics Using the HP 4280A 1MHz C Meter / C-V Plotter
323 1983 3746A Detection of High Level Signals in FDM Networks
324-1 1983 445XX Understanding Your Bed-of-Nails Test Fixture
325-2 ? 5528A Machine Tool Calibration - Laser Measurement System 5528A - HP85
325-12 1990 5517B-10705A Non-Contact Measurements with Laser Interferometers
326 1986 - Principles of Microwave Connector Care (For Higher Reliability and Better Measurements)
328-1 1983 3488A ++ Practical Test System Signal Switching
329 1983 86XX-83XX Performance Characteristics of HP Microwave Signal Sources - A Comparison
329 1986 86XX-83XX Microwave Signal Sources Spectral Purity Characteristics of HP Microwave Signal Sources
330-1 1985 8566-9836 Automatic MIL-STD EMI Testing Using the HP 85864A/B EMI Measurement Software
331-1 1986 8566-85650A Automatic CISPR EMI Testing For Conductef Emissions Using the HP 85864A/B EMI Measurement Software
332 1984 11713A-333XX Microwave Switching From SPDT to Full Access Matrix
333 1984 3054A Monitoring of a Solar Collector and Heat Reclamation Heating System
334 1984 4063A Automation of Semiconductor Parameter Analysis - Practical Applications of the HP 4063A Semiconductor Parameter Analysis System
339 1985 4194A Parametric Analysis for Electronic Components and Circuit Evaluation Using the 4194A Impedance / Gain-Phase Analyzer
339-1 1985 4194A Impedance Characterisation of Resonators Using the 4194A Impedance / Gain-Phase Analyzer
339-2 1986 4194A Characteristic Impedance Measurement of PC Board Circuit Patterns - HP 4194A Application Information
339-3 1986 4194A Crosstalk and Impedance Measurements of PC Board Patterns - HP 4194A Application Information
339-4 1986 4194A Measuring the Characteristic Impedance of Balanced Cables - HP 4194A Application Information
339-5 1986 4194A Multi-Frequency C-V Measurements and Doping Profile Analysis of Semiconductors - HP 4194A Application Information
339-6 ? 4194A Static Head Testing of Disk Drives - HP 4194A Application Information
339-7 1987 4194A Efficient Evaluation of LISNs and Voltage Probes for EMI Tests - HP 4194A Impedance / Gain-Phase Analyzer
339-8 1987 4194A Constant Current Measurements Using the HP 4194A - HP 4194A Impedance / Gain-Phase Analyzer
339-9 1987 4194A Negative Impedance Measurements of Crystal Oscillators - HP 4194A Impedance / Gain-Phase Analyzer
339-10 1987 4194A Input / Output and Reflection Coefficient Measurements - HP 4194A Impedance / Gain-Phase Analyzer
339-11 1987 4194A Filter Test for Production and Incoming Inspection - HP 4194A Impedance / Gain-Phase Analyzer
339-13 1987 4194A Measuring the dielectric Constant of Solid Materials - HP 4194A Impedance / Gain-Phase Analyzer
339-14 1988 4194A Testing Switching Power Supplies Using the HP 4194A
339-20 1987 414X Role of DC Parametric Test in High Speed Digital and Microwave Semiconductor Component Manufacturing
340-1 1990 - Reducing Fixture-Induced Test Failures
341-1 ? 1630G-8175A Testing a Complex LSI / VLSI IC with a Low-Cost Measurement Set-UP
341-2 ? 8175A Simulating Sensor Signals - Calibrating and Testing an IR Detecting System with the HP 8175A
343-1 1986 8780A-8980A Vector Modulation Measurements - Measurement Applications for Digital Microwave Radio
343-2 1988 8780A-8981A Dynamic Component Test Using Vector Modulation Analysis
343-3 1986 8780A-8980A Vector Modulation Measurements - Coherent Pulsed Tests of Radar and Electronic Warfare Systems
343-4 1987 8980A Measuring Demodulator Image Rejection Using the HP 8980A Vector Analyzer
343-5 1988 8780A-8770A Calibrated Microwave System for Complex Arbitrary Signal Simulation Using HP 8780A and HP 8770A Arbitrary Waveform Synthesizer
343-6 1989 878X-3708A Testing Digital Microwave Receivers Using a Calibrated Source
344 1986 54100A-D Bandwidth and Sampling Rate in Digitizing Oscilloscopes
345-1 1986 8757A ++ Amplifier Measurements Using the Scalar Network Analyzer
345-1 2001 8757A ++ Microwave Component Measurements - Amplifier Measurements Using the Scalar Network Analyzer
345-2 1987 8757A ++ Mixer Measurements Using the Scalar Network Analyzer
346 1986 41XX-42XX A Guideline for Designing External DC Bias Circuits for the HP 4192A, 4194A, 4274A, 4275A, 4276A, 4277A
346-2 1992 4194A-4195A Balanced Circuit Measurement wth an Impedance Meter / LCR Meter / Network Analyzer
346-3 1992 4285A Effective Impedance Measurement Using OPEN / SHORT / LOAD Correction
346-4 1999 42XX 8 Hints for Successful Impedance Measurements
348 1986 - Voltage and Time Resolution in Digitizing Oscilloscopes
349 1986 - PC Instruments Applications Handbook - Explore Ways to Improve Your Test and Measurement Productivity
351 1987 8753A Characterization of High-Speed Optical Components with an RF Network Analyzer
355A 1992 37XX Digital Radio Theory and Measurements
355-1 1992 37XX-8590A A Description of the Wide Range of Test Solutions Available From HP for Digital Radio Test
356 1987 4142B-S300 HP 4142B Modular DC Source / Monitor Practical Applications - High Speed DC Characterisation of Semiconductor Devices Sub pA to 1A
356-1 1988 4142B-S300 HP 4142B Modular DC Source / Monitor Practical Applications - Techniques and Applications for High Throughput and Stable Characterization
357-3 1988 4195A Advanced Filter Evaluation and Limit Testing with HP 4195A Network / Spectrum Analyzer
357-4 1989 4195A Testing Magnetic Disk Read Circuits Using the HP 4195A
358-1 1987 5371A HP 5371A Frequency and Time Interval Analyzer - Characterization of Frequency-Agile Signal Sources
358-2 1987 5371A HP 5371A Frequency and Time Interval Analyzer - Jitter and Wander Analysis in Digital Communications
358-3 1988 5371A HP 5371A Frequency and Time Interval Analyzer - Time Domain Characterization of Magnetic Disk Drives
358-4 1989 5372A HP 5372A Frequency and Time Interval Analyzer - Pre-Trigger Simplifies VCO Step Response Measurements
358-5 1989 5372A HP 5372A Frequency and Time Interval Analyzer - Clock Rate Independent Jitter Measurements for Digital Communications Systems
358-5 1990 5372A Mesure de Gigue Indépendante de la Vitesse d'Horloge pour les Systèmes de Transmission Numériques (French Translation of AN 358-5)
358-6 1989 5372A HP 5372A Frequency and Time Interval Analyzer - Characterizing Transient Timing Errors in Disk and Tape Drives
358-7 1989 5372A HP 5372A Frequency and Time Interval Analyzer - Analysing Phase-Locked Loop Transients in the Modulation Domain
358-8 1989 5372A HP 5372A Frequency and Time Interval Analyzer - Single Shot BPSK Signal Characterization
358-9 1989 5372A HP 5372A Frequency and Time Interval Analyzer - Modulation Domain Techniques for Measuring Complex Radar Signals
358-9 1991 5372A Technique de Mesure de Signaux Radar Complexes dans le Domaine de Modulation (French Translation of AN 358-9)
358-10 1989 5372A HP 5372A Frequency and Time Interval Analyzer - Characterizing Baker Coded Modulation in Radar Systems
358-11 1989 5372A HP 5372A Frequency and Time Interval Analyzer - Characterizing Shirp Coded Modulation in Radar Systems
358-12 1990 5371A-5372A Simplifiez les Mesures de Stabilité en Fréquence à l'Aide de l'Analyse de Variance d'Allan Intégrée (French Translation of AN 358-12)
358-13 1990 5372A Analysing Phase-Locked Loop Capture and Tracking Range
360 1987 378X Jitter Tolerance Testing Using Phase or Frequency Modulated Sources and Bit Error Rate Test Sets
361 1988 815X Traceability of Optical Power Measurements - How Traceability to National Standards is Provided by Hewlett-Packard
362 1988 815X-3764A Bit Error Rate Measurements on Optical Fiber Systems
364-2 1990 3709B Digital Radio Testing with British Telecom
366-1 1986 815X-8145A How to Measure Insertion Loss of Optical Components
366-2 1988 815X How to Measure Return Loss of Optical Components
366-3 1988 8145A How to Measure Return Loss in Optical Links Using the HP 8145A OTDR
369-1 1988 4284A Optimizing Electronic Component and Material Impedance Measurements Taking Full Advantage of the HP 4284A Precision LCR Meter
369-2 1988 4284A Tantalum Electrolytic Capacitor Measurements in Production and Quality Control Departments - HP 4284A Precision LCR Meter
369-3 1988 4284A Impedance Measurements of Magnetic Heads Using Constant Current in Production and Quality Control Departments
369-4 1988 4284A Recommending Electronic Manufacturers to Perform Incomming Inspection - HP 4284A Precision LCR Meter
369-5 1988 4284A Multi-Frequency C-V Measurements of Semiconductors - HP 4284A Precision LCR Meter
369-6 1988 4284A Impedance Testing Using Scanner - HP 4284A Precision LCR Meter
369-7 1988 4284A Measurement of Capacitance Characteristics of Liquid Crystal Cell with HP 4284A Precision LCR Meter
369-8 1989 4284A-42841A Wide Range DC Current Biased Inductance Measurement with HP 4284A Precision LCR Meter / HP 42841A Bias Current Source
369-9 1989 4284A-4285A Improve Electronic Product Quality and Performance with HP Precision LCR Meters - HP 4284A and HP 4285A Precision LCR Meters
371 1992 71400 HP 71400 Lightwave Signal Analyzer - Measuring Modulated Light
372-1 1988 60XX Power Supply Testing
372-2 1988 60XX Battery Testing
372-3 1988 60XX-66XX Power Components Testing
374-1 1988 8510B-8340B Antenna Measurements - Manual Pattern Measurements Using the HP 8510B
376-1 1988 662X Biasing Three-Terminal Devices for Test - A precise Solution for Component Evaluation and Sub-Assembly Testing…
377-1 1989 5361A Automatic Frequency Profiling of Chirped Radar Pulses Using the HP 5361A 20 GHz Pulse / CW Microwave Counter
377-2 1989 5361A Automatic Characterization of Microwave VCO's Using the HP 5361A 20 GHz Pulse / CW Microwave Counter
377-3 1989 5361A Frequency Profiling Without a Pulse Generator Using the HP 5361A 20 GHz Pulse / CW Microwave Counter's Built-In Profiling
377-4 1990 5361B Frequency and Phase Profiling Simplified with the HP 5361B Pulse / CW Microwave Counter
378-1 1989 3585B Harmonic Distorsion Measurements - Enhancing Speed and Performance with Spectrum Analysis
379-1 1989 11757A Measuring Digital Microwave Radio M-Curves / Signatures
379-2 1990 11758T Measuring Microwave Radio Antenna Return Loss Using the HP 11758T Digital Radio Test System
380-1 1989 16451B Dielectric Constant Measurement of Solid Materials Using the HP 16451B Dielectric Test Fixture
380-2 1990 4195A-4284A Measuring Cable Parameters - HP Precision LCR Meters and Impedance Analyzers
380-3 1995 - Evalution of Colloids by Dielectric Spectroscopy
381 1989 5412X-8131A A Test Setup for Characterizing High-Speed Logic Devices
381 1990 5412X-8131A Configuration de Test pour la Caractérisation des Composants Logiques rapides (French Translation of AN 381)
381-1 1990 5412X-8131A Configuration de Test pour la Caractérisation d'un Trigger de Schmitt rapide (French Translation of AN 381-1)
383-1 1989 4142B Simplification of DC Characterization and Analysis of Semiconductor Devices
383-2 1990 4142B Automation of DC Characterization and Analysis of Semiconductor Devices
385 1989 3048A Millimeter Measurements Using the HP 3048A Phase Noise Measurement System
386 1990 3048A Pulsed Carrier Phase Noise Measurements Using the HP 3048A Phase Noise Measurement System
387 1990 378X-37721A High Productivity Measurements in Digital Transmission
388 1990 - Signal Generator Spectral Purity
392-1 1990 165XX How the Right Preprocessor Interface Can Simplify Logic Analysis - Aerospace and Defense Applications
392-2 1990 165XX How the Right Preprocessor Interface Can Simplify Logic Analysis - PC and PC Add-On Applications
392-3 1990 165XX How the Right Preprocessor Interface Can Simplify Logic Analysis - VME / VXI Applications
392-4 1990 165XX How the Right Preprocessor Interface Can Simplify Logic Analysis - Workstation / Server Applications
392-5 1990 165XX How the Right Preprocessor Interface Can Simplify Logic Analysis - Computer Peripheral Applications
392-6 1990 165XX How the Right Preprocessor Interface Can Simplify Logic Analysis - Industrial / Automotive Applications
393 1990 3562A Monitoring of Ultrasonic Wire Bonding Machines
397-1 1990 4951X-4952A ISDN Testing Techniques for the HP 4954I and the HP 4951C / HP 4952A WAN Protocol Analyzers
398-2 1990 - Correlation of Timing Measurements
399 1990 4972A Problem Isolation Techniques for Ethernet 802.3 Local Area Networks
401 ? - The AN 401 Series - HP 1000/HP-IB programming Application Notes
401-1 ? HP1000 HP 1000/HP-IB Programming Proceedures 5953-2800
401-2 ? HP1000-59307 59307 VHF Switch - HP-IB - HP 1000 Computer Programming Guide 5953-2801
401-3 1979 HP1000-5345A 5345A Electronic Counter - HP-IB - HP 1000 Computer Programming Guide 5953-2802
401-4 1979 HP1000-5342A 5342A Microwave Frequency Counter - HP-IB - HP 1000 Computer Programming Guide 5953-2803
401-5 ? HP1000-5328A 5328A Counter - HP-IB - HP 1000 Computer Programming Guide 5953-2804
401-6 ? HP1000-3438A 3438A Digital Multimeter - HP-IB - HP 1000 Computer Programming Guide 5953-2805
401-7 1979 HP1000-3455A 3455A Digital Voltmeter - HP-IB - HP 1000 Computer Programming Guide 5953-2806
401-8 ? HP1000-59309A 59309A Digital Clock - HP-IB - HP 1000 Computer Programming Guide 5953-2807
401-9 ? HP1000-6002A 6002A Power Supply - HP-IB - HP 1000 Computer Programming Guide 5953-2808
401-10 ? HP1000-3437A 3437A Digital Voltmeter - HP-IB - HP 1000 Computer Programming Guide 5953-2809
401-11 ? HP1000-3495A 3495A Scanner - HP-IB - HP 1000 Computer Programming Guide 5953-2810
401-12 ? HP1000-3582A 3582A Spectrum Analyzer - HP-IB - HP 1000 Computer Programming Guide 5953-2811
401-13 ? HP1000-3325A 3325A Function Generator - HP-IB - HP 1000 Computer Programming Guide 5953-2812
401-14 ? HP1000-4262A 4262A Digital LCR Meter - HP-IB - HP 1000 Computer Programming Guide 5953-2813
401-15 1979 HP1000-8672A 8672A Synthesized Signal Generator - HP-IB - HP 1000 Computer Programming Guide 5953-2814
401-16 1979 HP1000-436A 436A Microwave Power Meter - HP-IB - HP 1000 Computer Programming Guide 5953-2815
401-17 ? HP1000-8620C 8620C Sweep Oscillator - HP-IB - HP 1000 Computer Programming Guide 5953-2816
401-18 ? HP1000-59306A 59306A Relay Actuator - HP-IB - HP 1000 Computer Programming Guide 5953-2817
401-19 ? HP1000-8660C 8660C Synthesized Signal Generator - HP-IB - HP 1000 Computer Programming Guide 5953-2818
401-20 ? HP1000-9871A 9871A Character Impact Printer - HP-IB - HP 1000 Computer Programming Guide 5953-2819
401-21 ? HP1000-6942A 6942A Multiprogrammer II - HP-IB - HP 1000 Computer Programming Guide 5953-2820
417-1 1986 9000-S200-S300 HP Basic I/O Concepts for the HP 9000 Series 200 and Series 300
421-1 1987 3852-S300-1000 Data Aquisition & Computer Aided Test Applications Summary Series - Commercial Energy Conservation
421-2 1987 3852-S300-1000 Data Aquisition & Computer Aided Test Applications Summary Series - Fan Testing
421-3 1987 3852-S300-1000 Data Aquisition & Computer Aided Test Applications Summary Series - Vehicle Body Testing
421-4 1987 3852-S300-1000 Data Aquisition & Computer Aided Test Applications Summary Series - Wastewater Treatment
421-5 1987 3852-S300-1000 Data Aquisition & Computer Aided Test Applications Summary Series - Jet Engine Controler Testing
421-6 1987 3852-S300-1000 Data Aquisition & Computer Aided Test Applications Summary Series - Internal Combustion Engine Testing
421-7 1987 3852-S300-1000 Data Aquisition & Computer Aided Test Applications Summary Series - Environmental / Autoclave Testing
421-8 1987 3852-S300-1000 Data Aquisition & Computer Aided Test Applications Summary Series - Communication Cable Testing
421-9 1987 3852-S300-1000 Data Aquisition & Computer Aided Test Applications Summary Series - Residential Facility Testing
421-10 1987 3852-S300-1000 Data Aquisition & Computer Aided Test Applications Summary Series - Canning Process Characterization
421-11 1987 3852-S300-1000 Data Aquisition & Computer Aided Test Applications Summary Series - Explosion Testing
421-12 1987 3852-S300-1000 Data Aquisition & Computer Aided Test Applications Summary Series - Materials Development
421-13 1987 3852-S300-1000 Data Aquisition & Computer Aided Test Applications Summary Series - Plating Line Control
421-14 1987 3852-S300-1000 Data Aquisition & Computer Aided Test Applications Summary Series - Battery Testing
421-15 1987 3852-S300-1000 Data Aquisition & Computer Aided Test Applications Summary Series - Pilot Plant Monitoring
421-16 1987 3852-S300-1000 Data Aquisition & Computer Aided Test Applications Summary Series - Jet Engine Testing
421-17 1987 3852-S300-1000 Data Aquisition & Computer Aided Test Applications Summary Series - Facility Management
421-18 1987 3852-S300-1000 Data Aquisition & Computer Aided Test Applications Summary Series - "Large Product" Characterization
421-19 1987 3852-S300-1000 Data Aquisition & Computer Aided Test Applications Summary Series - Missile System Testing
421-20 1987 3852-S300-1000 Data Aquisition & Computer Aided Test Applications Summary Series - Machine Monitoring Control
421-21 1987 3852-S300-1000 Data Aquisition & Computer Aided Test Applications Summary Series - Pharmaceutical Process Control
421-22 1987 3852-S300-1000 Data Aquisition & Computer Aided Test Applications Summary Series - Paper Process Characterisation
421-23 1987 3852-S300-1000 Data Aquisition & Computer Aided Test Applications Summary Series - Rolling Mill
421-24 1987 3852-S300-1000 Data Aquisition & Computer Aided Test Applications Summary Series - Appliance Testing
421-25 1987 3852-S300-1000 Data Aquisition & Computer Aided Test Applications Summary Series - Airframe Testing
421-26 1987 3852-S300-1000 Data Aquisition & Computer Aided Test Applications Summary Series - On-Road Vehicle Testing
421-27 1987 3852-S300-1000 Data Aquisition & Computer Aided Test Applications Summary Series - Pumping Station Control
421-28 1987 3852-S300-1000 Data Aquisition & Computer Aided Test Applications Summary Series - Receiver Testing
421-29 1987 3852-S300-1000 Data Aquisition & Computer Aided Test Applications Summary Series - Bed-of-Nails Testing for Digital to Analog Converters
421-30 1987 3852-S300-1000 Data Aquisition & Computer Aided Test Applications Summary Series - Environmental Test of Automotive Radios and Engine Controllers
421-31 1987 3852-S300-1000 Data Aquisition & Computer Aided Test Applications Summary Series - Sonar System Testing
421-32 1987 3852-S300-1000 Data Aquisition & Computer Aided Test Applications Summary Series - Environmental Test of Electronic Subassemblies
425 1990 4951C-4952A Le Contrôle et l'Entretien de Votre Réseau X,25 (French Translation of AN 425)
426 1989 9000-S300 File Sharing Between HP BASIC/WS, HP BASIC/UX, and HP-UX for HP 9000 Series 300 Computers
907 1967 - The Hot Carrier Diode - Theory, Design and Application
909 1966 - Electrical Isolation Using the HPA 4310
910 1968 - Optoelectronic Coupling for Coding, Multiplexing and Channel Switching
911 ? - Low Level DC Operation Using HP Photochoppers
912 ? - An Attenuator Design Using PIN Diodes - Constant Impedance Current Controlled 10 MHz to 1,0 GHz Bandwidth
913 1967 - Step Recovery Diode Frequency Multiplier Design
914 1967 - Biasing and Driving Considerations for PIN Diode RF Switches and Modulators
915 1967 - Threshold Detection of Visible and Infrared Radiation with PIN Photodiodes
916 1967 - HPA GaAs Sources
917 1967 - HPA PIN Photodiode
918 1968 - Pulse and Waveform Generation with Step Recovery Diodes
919 1968 - Optmizing Signal-to-Noise Ratio in Photochopper Applications
920 1968 - Harmonic Generation Using Step Recovery Diodes and SRD Modules
921 ? - The 33800 Series Mixer / Detector Module
922 ? - Applications of PIN Diodes
923 ? - Hot Carrier Diode Video Detectors
928 ? - Ku-Band Step Recovery Multiplier
929 ? - Fast Switching PIN Diodes
930 1970 - Handling and Assembling HP Transistor Chips
931 1970 - Solid State Alphanumeric Display - Decoder / Driver Circuitry
932 1974 - Selection and Use of Microwave Diode Switches and Limiters
933 1970 - Monolithic Solid State Seven Segment Displays
935 1971 - Microwave Power Generation and Amplification Using Impatt Diodes
936 1971 - High Performance PIN Attenuator for Low Cost AGC Applications
938 ? - Solid State Lamp Installation Note
942 1973 - Shottky Diodes for High Volume, Low Cost Applications
944-1 1973 - Microwave Transistor Bias Considerations
1006 1980 LED-DISPLAY Seven Segment LED Display Applications
1011 1984 - Conception et Mise en Œuvre des Codeurs Incrémentiels HEDS-5000 et HEDS-6000
1025 1985 - Applications and Circuit Design for the HEDS-7000 Series Digital Potentiometer
1034 1988 815X How to Make Accurate Fiber Optic Power Measurements
1200-1 1990 53310A HP 53310A Modulation Domain Analyzer - Simplified Motor Spin-Up Analysis
1200-2 1990 53310A HP 53310A Modulation Domain Analyzer - Direct Characterization of Motion Control Systems
1200-3 1990 53310A HP 53310A Modulation Domain Analyzer - VCO Step Response Analysis Made Easy
1200-4 1990 53310A HP 53310A Modulation Domain Analyzer - Quick Identification of Periodic Jitter Sources
1200-5 1990 53310A HP 53310A Modulation Domain Analyzer - Fast Characterization of Pulse Width Encoded Data
1200-6 1990 53310A HP 53310A Modulation Domain Analyzer - Simple Analysis of Frequency Modulation
1200-7 1990 53310A HP 53310A Modulation Domain Analyzer - Simplified Analysis of Phase-Locked Loop Capture and Tracking Range
1200-8 1990 53310A HP 53310A Modulation Domain Analyzer - Single Shoot Frequency Profiling of Chirped Radars Made Easy
1200-9 1990 53310A HP 53310A Modulation Domain Analyzer - Histograms Simplify Analysis of Random Jitter
1200-10 1990 53310A HP 53310A Modulation Domain Analyzer - Examine Channel Switching Characteristics of Cellular Radios
1200-11 1993 53310A HP 53310A Modulation Domain Analyzer - Examine GMSK Modulation in GSM and PCN Mobile Communications Systems
1200-12 1991 53310A HP 53310A Modulation Domain Analyzer - Peak Deviation and Center Frequency Measurements for CT2 and DECT Radios
1202-1 1990 8751A HP 8751A Network Analyzer 5Hz to 500MHz - Designing Impedance Matching Networks with the HP 8751A
1202-2 1991 8751A HP 8751A Network Analyzer 5Hz to 500MHz - 17 Fixtures, Test Sets and Accessories for the HP 8751A
1202-3 1991 8751A HP 8751A Network Analyzer 5Hz to 500MHz - 3 Steps to Better Baseband, IF and RF Design with the HP 8751A
1205 1991 4142B Efficient Microwave Bias and Test Using the HP 4142B Modular DC Source / Monitor
1206-1 1991 HP Vee Complete Data Acquisition Solutions with HP VEE-Test
1206-2 1991 HP Vee Design Characterization Using HP VEE-Test
1207-1 1991 823XX Multiprocessing with HP Measurement Coprocessors
1207-2 1991 823XX Installing Multiple HP Measurement Coprocessors
1210-1 1991 4194A Characterizing IC Packages with Impedance Measurements and the UTP-3000 Test Fixture
1210-3 1991 813X Simulating Noise Signals for Tolerance Testing
1210-5 1991 54121T Characterizing IC Packages with TDR / TDT and the UTP-3000 Test Fixture
1210-6 1991 5412X-8131A Characterizing Jitter with a Digitizing Oscilloscope
1210-10 1992 54720A-8133A Timing Considerations in Clock Distribution Networks
1210-11 1992 8510-87XX Simulation and Optimization Methods for MCM Substrates
1210-14 1992 4194A-875X Electrical Characterization Methods for MCM Substrates
1210-16 1994 - Characterizing the Performance of High-Speed Digital-to-Analog Converters
1211-1 1991 37722-37732 Standard and CRC-4 Frame Testing
1211-2 1991 377XX Testing N x 64 Kb/s Services
1211-3 1991 377XX Testing Sub-Rate Data Services
1213 1991 3588A-3589A Better Noise Measurements with the HP 3588A & HP 3589A
1214 1991 54510A Sequential Single-Shot Optimizes Speed, Memory Depth and Throughput
1216-1 1992 4142B Performing High-Speed Parameter Extractions on High-Power Devices Using the HP 4142B Modular DC Source / Monitor
1216-2 1992 4142B An Automated DC Parameter Measurement System for Power Modules and Smart Power ICs Using the HP 4142B Modular DC Source / Monitor
1217-1 1992 419X-875X Basics of Measuring the Dielectric Properties of Materials
1218-1 1992 7145X Optical Spectrum Analysis Basics
1219-1 1992 82335B HP 82335B HP-IB for Windows - Utilizing DDE for Test and Measurement Applications
1219-2 1992 82335B HP 82335B HP-IB for Windows - Creating Instrument Control Applications with Visual Basic and HP-IB for Windows
1219-3 1992 82335B HP 82335B HP-IB for Windows - Creating Software Front Panels for Your VXI Instruments
1221 1992 54701A Differential Measurements on Wideband Signals
1223 1992 16550A Logic Analyzer Triggering Applications for the HP 16550A 100 MHz State / 500 MHz Timing Module
1224-1 1992 4338A-4339A Contact Resistance and Insulation Resistance Measurements of Electro-Mechanical Components
1224-2 1992 4339A Insulation Resistance Measurements of the Plate Type Materials
1224-3 1992 4263A Effective Transformers / LF Coils Testing
1224-4 1992 4263A Effective Electrolytic Capacitors Testing
1225-1 1992 16542A Imaging and DSP Testing with the HP 16542A
1225-2 1992 16542A Cache Hit or Miss Analysis with the HP 16542A
1225-3 1992 16542A Digital Video Testing with the HP 16542A
1225-4 1992 16542A Analog-to-Digital Converter Testing with the HP 16542A
1230 1992 35665A Sound Power Measurements
1237-1 1993 - Maximizing Revenue with In-Service Testing-Introduction
1241 1993 54720-1143A Microprobing with the Fine-Pitch Active Probe
1242 1992 - Microprobing Essentials for Fine Pitch Modules
1245 1993 16500X PC Network Connectivity with the HP 16500L Interface Module
1246 1993 6060B Pulsed Characterization of Power Semiconductors Using Electronic Loads
1253 1994 VXI Real-Time System Measures Aircraft Flight Characteristics
1260-1 1993 4396A Combining Network and Spectrum Analysis and IBASIC to Improve Device Characterization and Test Time
1266-1 1994 16500X Intel 80960CA Software Debug Using a Logic Analyzer and an In-Circuit Debugger
1267 1995 71501B-703XX Frequency Agile Jitter Measurement System
1270-1 1995 VXI ++ Final Test and Alignment for Cellular Phones & Failure Analysis and Repair for Cellular Phones
1270-2 1995 VXI ++ VHF Transceiver Testing
1270-3 1995 VXI ++ Prototype Aircraft Jet Engine Characterization and Test
1270-4 1995 VXI ++ Electronic Heater Valves Testing
1270-5 1995 VXI ++ Vehicle Body Testing
1270-6 1995 VXI ++ On Road Vehicle Testing
1270-7 1995 VXI ++ Communication Cable Testing
1270-8 1995 VXI ++ Airframe Testing
1270-9 1995 VXI ++ Jet Engine Controller Testing
1270-10 1995 VXI ++ Jet Engine Testing
1270-11 1995 VXI ++ Environmental Test of Automotive Radios and Engine Controllers
1270-12 1995 VXI ++ Automotive Relay Modules Testing
1272 1996 58503A-59551A GPS and Precision Timing Applications
1273 1995 6840 Compliance Testing to the IEC 1000-3-2 (EN 61000-3-2) and IEC 1000-3-3 (EN 61000-3-3) Standards
1279 1996 5071A-58503A HP SmartClock Technology - Improving Oscillator Long-Term Stability for Synchronization Applications
1279 1998 5071A-58503A HP SmartClock Technology - Improving Oscillator Long-Term Stability for Synchronization Applications
1286-1 1997 856X-859X 8 Astuces pour Améliorer vos Analyses de Spectre (French Translation of AN 1286-1)
1287-1 1997 87XX Understanding the Fundamental Principles of Vector Network Analysis
1287-2 1997 87XX Exploring the Architectures of Network Analyzers
1287-3 1997 87XX Applying Error Correction to Network Analyzer Measurements
1287-4 1997 87XX Network Analyzer Measurements: Filter and Amplifier Examples
1287-7 1998 87XX Improving Network Analyzer Measurements of Frequency-Translating Devices
1288-1 1997 4396B Combining Network and Spectrum Analyses and IBASIC to Improve Device Characterization and Test Time
1288-2 1994 4396B Configuring the HP 4396B for Optical / Electrical Testing
1288-4 1997 4396B How to Characterize CATV Amplifiers Effectively
1289 1997 - The Science of TimeKeeping
1291-1 1997 87XX-8510 8 Hints for Making Better Network Analyzer Measurements
1293 1997 E435X Sequential Shunt Regulation - Regulating Satellite Bus Voltage
1296 1997 - LMDS - The Wireless Interactive Broadband Access Service
1297 1997 42XX-43XX-87XX Solution for Measuring Permittivity and Permeability - Meeting Tomorrow's Material Test Challenges
1298 1997 - Digital Modulation in Communications Systems - An Introduction
1299 1997 37778A-71451B Introduction to BER Testing of WDM Systems
1303 1998 859X-856X Spectrum Analyzer Measurements and Noise - Measuring Noise and Noise-Like Digital Communications Signals with a Spectrum Analyzer
1304-2 1988 54750A-83480A Time Domain Reflectometry Theory
1304-4 2000 54750A Measuring Characteristic Impedance of Short RAMBUS Motherboard Traces and Small-Outline RIMM's
1307 1998 87XX-85XX Testing CDMA Base Station Amplifiers - Measurements Fundamentals of Characterizing the Linear and Non-Linear Behavior of CDMA Amplifiers
1308-1 1998 4395A-4396A Network, Spectrum, and Impedance Evaluation of Electronic Circuits and Components
1310 1999 - Mobile Communications Device Testing - Considerations when Selecting a System Power Supply
1313 2000 - Agilent Technologies Wireless Test Solutions - Testing and Troubleshooting Digital RF Communications Transmitter Designs
1316 1999 85XX Optimizing Spectrum Analyzer Amplitude Accuracy
1323 2000 - Internet Advisor - Testing and Troubleshooting Medium and High Speed Frame Relay Networks
1333 1999 - Performing Bluetooth RF Measurements Today
1333 2000 - Agilent - Performing Bluetooth RF Measurements Today
1370-1 2000 HP Vee Data Logging Using Remote Programming
1550-6 1992 8702-8703 High-Speed Lightwave Component Analysis


The original source of the Introduction and most of this information was the multi-page list at:
     http://www.hpmemoryproject.org/ressources/resrc_an_01.htm (Not associated with the Hewlett-Packard Company)
That list has not been updated since 2014, when Curator Marc Mislanghe passed away.
Where PDF copies exist at HP Memory Project, they are linked via columns 1 & 4.

Here the list has been converted to a single-page, tidied-up html format by TerraHertz, and updated with further AN titles as they are found. URL: http://everist.org/spacejunk/want/HP_Application_Notes.htm

Other sources of scanned HP Application Notes:

I take the view that it is important to preserve the paper originals of technical documents such as the HP Application Note series. For multiple reasons, including trust of information veracity and typographic/image quality. Contemporary scanning utilities and file formats (eg PDF) are inadequate for preserving the spirit as well as the raw content of such works. Not to mention that most people undertaking scanning, have combinations of resources, skills and objectives that usually result in file visual quality ranging from mediocre to appalling. In general very disrespectful to the creators of the original document. Some even destroy the paper original during or after scanning. For convenience of scanning, or by reasoning "Now it's in digital form the paper original is a waste of space."

In contrast, I collect these works to preserve the genuine articles for posterity (and for my own reference.) I also experiment with practical methods of achieving higher quality/utility digital copies, with the aim of eventually publishing a combined 'how to' tutorial and tools. Plus scanning my collection of technical and cultural works, using those methods.
A few such experiments are linked in the table above; see #64-3, 73, 139.

Consequently I am more interested in obtaining paper originals than already scanned digital copies as PDF files.
Here's my list of HP App Notes I have so far.
If you have any physical paper HP Application Notes that I do not already have, that you would like to donate, please contact me: sjm at everist.org
In some cases I could buy small numbers of ANs offered for sale, but I am quite poor in this phase of my life.